Acoustic microscopy for imaging and characterization

MRS Bulletin

Volumn 21, Issue 10, 1996, Pages 30-35

  Briggs, Andrew ^a   Kolosov, Oleg ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043199151     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400031614     Document Type: Article

References (19)

1. G.A.D. Briggs, Acoustic Microscopy (Clarendon Press, Oxford, 1992).
2. SAM 100, Krämer Scientific Instruments GmbH, Lerchenweg 16-18, Postfach 35729, Herborn 35745, Germany.
3. G. Pfannschmidt, "Characterization of Electronic Components by Acoustic Microscopy," in Advances in Acoustic Microscopy 2, edited by G.A.D. Briggs and W. Arnold (Plenum Press, New York) in press.
4. G.M. Crean, C.M. Flannery, and S.C.O. Mathuna, "Acoustic Microscopy Analysis of Microelectronic Interconnection and Packaging Technologies," in Advances in Acoustic Microscopy 1, edited by G.A.D. Briggs (Plenum Press, New York, 1995).
5. J.D. Crossen, J.M. Sykes, D. Knauss, G.A.D. Briggs, and J.P. Lomas, "The Influence of Water on the Coating-Material Interface: Adhesion Measurements and Scanning Acoustic Microscopy," in Advances in Corrosion Protection by Organic Coatings 11, edited by J.D. Scantlebury and M. Kendig (The Electrochemical Society, 1994) p. 274.
6. D. Knauss, T. Zhai, G.A.D. Briggs, and J.W. Martin, "Measuring Short Cracks by Time-Resolved Acoustic Microscopy," in Advances in Acoustic Microscopy 1, edited by G.A.D. Briggs (Plenum Press, New York, 1995) p. 49.
7. C.W. Lawrence, G.A.D. Briggs, and C.B. Scruby, "Acoustic Microscopy of Ceramic-Fibre Composites: Part II, Glass-Ceramic-Matrix Composites," J. Mater. Sci. 28 (1993) p. 3645.
8. J.D. Achenbach, J.O. Kim, and Y-C. Lee, "Measuring Thin-Film Elastic Constants by Line-Focus Acoustic Microscopy," in Advances in Acoustic Microscopy I, edited by G.A.D. Briggs (Plenum Press, New York, 1995) p. 153.
9. Z. Sklar, P. Mutti, N.C. Stoodley, and G.A.D. Briggs, "Measuring the Elastic Properties of Stressed Materials by Quantitative Acoustic Microscopy," ibid. p. 209.
10. J. Kushibiki, H. Ishiji, T. Kobayashi, N. Chubachi, I. Sahashi, and T. Sasamata, "Characterization of 36°-YX LiTaOs Wafers by Line-Focus-Beam Acoustic Microscopy," IEEE Trans Ultrasonics Ferroelectrics Frequency Control 42 (1995) p. 83.
11. P.D. Warren, C. Pecorari, O.V. Kolosov, S.G. Roberts, and G.A.D. Briggs, "Characterisation of Surface Damage Via Surface Acoustic Waves," in Nanotechnology in press.
12. P. Mutti, C.E. Bottani, G. Ghislotti, M. Beghi, G.A.D. Briggs, and J.R. Sandercock, "Surface Brillouin Scattering - Extending Surface Wave Measurements to 20 GHz," in Advances in Acoustic Microscopy I, edited by G.A.D. Briggs (Plenum Press, New York, 1995) p. 249.
13. BriSc, Bede Scientific Instruments Ltd., Lindsey Park, Bowburn, Durham DH6 5PF, UK; http://www.bede.co.uk.
14. P.D. Warren, C. Pecorari, O.V. Kolosov, S.G. Roberts, and G.A.D. Briggs, "Characterisation of Surface Damage Via Contact Probes," in Nanotechnology in press.
15. O. Kolosov, W. Arnold, K. Yamanaka, and G.A.D. Briggs, "Nanoscale Imaging of Dynamic Mechanical Properties by Ultrasonic Force Microscopy," in Acoustical Imaging, vol. 22, edited by P. Tortoli (Plenum Press, New York) in press.
16. O. Kolosov, K. Yamanaka, H. Ogiso, and H. Tokumoto, "Elastic Imaging With Nanoscale and Atomic Resolution by Ultrasonic Force Microscopy (UFM)" in Nanostructures and Quantum Effects (Springer-Verlag, 1994) p. 349.
17. K. Yamanaka, "New Approaches in Acoustic Microscopy for Noncontact Measurement and Ultra High Resolution," in Advances in Acoustic Microscopy I, edited by G.A.D. Briggs (Plenum Press, New York, 1995) p. 301.
18. O. Kolosov and K. Yamanaka, "Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope," in Jpn. J. Appl. Phys. Lett. 32 (1993) p. L1095.
19. O.V. Kolosov, K. Yamanaka, K. Watanabe, F. Sakai, and M. Yasutake, "Ultrasonic Atomic Force Microscope," Japan Patent Application, F1909, 5-133878, priority 11.05.93.