메뉴 건너뛰기




Volumn 88, Issue 11, 2000, Pages 6346-6354

The effect of postgrowth ion irradiation on the microstructure and the interface properties of amorphous carbon films on silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000834448     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1323751     Document Type: Article
Times cited : (17)

References (44)
  • 1
    • 0001336127 scopus 로고    scopus 로고
    • S. Logothetidis, Appl. Phys. Lett. 69, 158 (1996); S. Logothetidis and M. Gioti, Mater. Sci. Eng., B 46, 119 (1997).
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 158
    • Logothetidis, S.1
  • 24
    • 85037486252 scopus 로고    scopus 로고
    • JCPDS powder diffraction files 29-1126, 29-1127
    • JCPDS powder diffraction files 29-1126, 29-1127.
  • 25
    • 85037469423 scopus 로고    scopus 로고
    • JCPDS powder diffraction files 29-1129
    • JCPDS powder diffraction files 29-1129.
  • 27
    • 85037464731 scopus 로고    scopus 로고
    • JCPDS powder diffraction file 41-1487
    • JCPDS powder diffraction file 41-1487.
  • 28
    • 85037459461 scopus 로고    scopus 로고
    • JCPDS powder diffraction file 06-0675
    • JCPDS powder diffraction file 06-0675.
  • 29
    • 85037473212 scopus 로고    scopus 로고
    • JCPDS powder diffraction file 19-0268
    • JCPDS powder diffraction file 19-0268.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.