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Applied Physics Letters

Volumn 74, Issue 22, 1999, Pages 3380-3382

Electrical and structural characterization of AlxGa1-xN/GaN heterostructures grown on LiGaO2 substrates

(4) Kang, Sangbeom a Doolittle, William A a Brown, April S a Stock, Stuart R b

a GEORGIA INSTITUTE OF TECHNOLOGY (United States)

b Georgia Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000803403 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.123351 Document Type: Article

Times cited : (19)

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