메뉴 건너뛰기




Volumn 60, Issue 20, 1999, Pages 14372-14381

Analysis of surface structures through determination of their composition using STM: Si(100)4×3-In and Si(111)4×1-In reconstructions

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000646344     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.14372     Document Type: Article
Times cited : (52)

References (53)
  • 11
    • 0000805072 scopus 로고    scopus 로고
    • O. Bunk, et al., Phys. Rev. B. 60, 13 905 (1999).
    • (1999) Phys. Rev. B , vol.60 , pp. 13 905
    • Bunk, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.