Structural transformations of the Si(111)2 × 2-In surface induced by STM tip and thermal annealing

Applied Surface Science

Volumn 121-122, Issue , 1997, Pages 183-186

  Saranin, A A ^a   Numata, T ^a   Kubo, O ^a   Katayama, M ^a   Oura, K ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atom solid interactions; Indium; Low energy electron diffraction (LEED); Scanning tunnelling microscopy (STM); Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

ANNEALING; DEPOSITION; DESORPTION; DIFFUSION IN SOLIDS; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE ROUGHNESS; SURFACE TREATMENT;

SURFACE RECONSTRUCTION; SURFACE TOPOGRAPHY;

SEMICONDUCTING INDIUM;

EID: 17944386995     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00284-5     Document Type: Article

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