Structure determination of the indium induced Si(001)-(4 × 3) reconstruction by surface X-ray diffraction and scanning tunneling microscopy

Applied Surface Science

Volumn 123-124, Issue , 1998, Pages 104-110

  Bunk, O ^a   Falkenberg, G ^a   Seehofer, L ^a   Zeysing, J H ^a   Johnson, R L ^a   Nielsen, M ^b   Feidenhans'l, R ^b   Landemark, E ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Indium; Scanning tunneling microscopy; Silicon; Strain relief; Surface structure; Surface X ray diffraction

Indexed keywords

RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM; SEMICONDUCTING SILICON; STRAIN; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

PATTERSON FUNCTION ANALYSIS; TRIMERS;

SURFACE STRUCTURE;

EID: 0031685887     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00472-8     Document Type: Article

References (10)

1. J. Knall, J.-E. Sundgren, G.V. Hansson, J.E. Green, Surf. Sci. 166 (1986) 512.
2. H.W. Yeom, T. Abukawa, M. Nakamura, X. Chen, S. Suzuki, S. Sato, K. Sakaraoto, T. Sakamoto, S. Kono, Surf. Sci. 340 (1995) L983.
3. A.A. Baski, J, Nogami, C.F. Quate, Phys. Rev. B 43 (1991) 9316.
4. G. Falkenberg, L. Seehofer, R.L. Johnson, Surf. Sci. 371 (1997) 86.
5. H. Itoh, J. Itoh, A. Schmid, T. Ichinokawa, Surf, Sci. 302 (1994) 295.
6. B.E. Steele, D.M. Cornelison, L. Li, I.S.T. Tsong, Nucl. Instr. Meth. B 85 (1994) 414.
7. E. Vlieg, J. Appl. Cryst. 30 (1997) 532.
8. [S] I.K. Robinson, in: G.S. Brown, D.E. Moncton (Eds.), Handbook on Synchrotron Radiation, vol. 3, North-Holland, Amsterdam, 1991.
9. J.A. Ibers, W.C. Hamilton (Eds.), International Tables for X-ray Crystallography, vol. 4, Kynoch, Birmingham, 1974.
10. P.N. Keating, Phys. Rev, 145 (1966) 637.