Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy

Applied Physics Letters

Volumn 77, Issue 14, 2000, Pages 2228-2230

  Magtoto, N P ^a   Niu, C ^a   Ekstrom, B M ^a   Addepalli, S ^a   Kelber, J A ^a  

^a UNIVERSITY OF NORTH TEXAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000591417     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1313816     Document Type: Article

References (18)

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