True atomic resolution imaging on semiconductor surfaces with noncontact atomic force microscopy

Materials Research Society Symposium - Proceedings

Volumn 442, Issue , 1997, Pages 15-23

  Sugawara, Y ^a   Ueyama, H ^a   Uchihashi, T ^a   Ohta, M ^a   Yanase, Y ^a   Shigematsu, T ^a   Suzuki, M ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CRYSTAL LATTICES; POINT DEFECTS; SEMICONDUCTING SILICON; SURFACES;

ATOMIC RESOLUTION IMAGING; CONSTANT EXCITATION MODE; CONSTANT VIBRATION MODE; DANGLING BOND; NONCONTACT ATOMIC FORCE MICROSCOPY;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0030654746     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)