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Volumn 12, Issue 3, 1999, Pages 509-514

193nm lithography with novel highly transparent acid amplifier for chemically amplified resists

Author keywords

193 nm; Acid amplification; Acid amplified resist; ArF; Chemical amplified resist

Indexed keywords


EID: 0000348528     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.12.509     Document Type: Article
Times cited : (17)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.