Surface analysis of ultraprecise polished chemical vapor deposited diamond films using spectroscopic and microscopic techniques

Journal of Applied Physics

Volumn 89, Issue 4, 2001, Pages 2434-2440

  Weima, J A ^a   Job, R ^a   Fahrner, W R ^a   Kosaca, G C ^a   Muller N ^b   Fries, T ^b  

^a UNIVERSITY OF HAGEN   (Germany)

^b Fries Research and Technology GmbH (FRT)   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000211815     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1342199     Document Type: Article

References (20)

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