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Additional forces (e.g., electrostatic) may be present between the tip and the sample, as in most AFM work
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Additional forces (e.g., electrostatic) may be present between the tip and the sample, as in most AFM work.
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9
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NaCl has been measured by AFM in the pioneering work of G. Meyer and N.M. Amer, Appl. Phys. Lett. 56, 2100 (1990); 53, 1045 (1988); 53, 2400 (1988). Unfortunately all of their published images are too small to show the effects reported here.
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Amer, N.M.2
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NaCl has been measured by AFM in the pioneering work of G. Meyer and N.M. Amer, Appl. Phys. Lett. 56, 2100 (1990); 53, 1045 (1988); 53, 2400 (1988). Unfortunately all of their published images are too small to show the effects reported here.
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(1988)
Appl. Phys. Lett.
, vol.53
, pp. 1045
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-
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18
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22644441587
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NaCl has been measured by AFM in the pioneering work of G. Meyer and N.M. Amer, Appl. Phys. Lett. 56, 2100 (1990); 53, 1045 (1988); 53, 2400 (1988). Unfortunately all of their published images are too small to show the effects reported here.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 2400
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19
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5544228026
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We have recently attempted to image the ripples with a commercial NSOM and with a commercial AFM that uses piezoresistive cantilevers. Unfortunately these techniques are thus far not able to image the smaller crystalline steps, so it is not surprising that we have not seen the ripples with them
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We have recently attempted to image the ripples with a commercial NSOM and with a commercial AFM that uses piezoresistive cantilevers. Unfortunately these techniques are thus far not able to image the smaller crystalline steps, so it is not surprising that we have not seen the ripples with them.
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