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Volumn 83, Issue 11, 1998, Pages 5840-5844

Spectroscopic ellipsometric study of the size evolution of Ge islands grown on Si (100)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000058173     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367441     Document Type: Article
Times cited : (12)

References (19)
  • 14
    • 3643073222 scopus 로고
    • Ellipsometry and Light Scattering Characterization of Semiconductor Surfaces
    • edited by P. Halevi North Holland Elsevier, Amsterdam
    • C. Pickering, Ellipsometry and Light Scattering Characterization of Semiconductor Surfaces in Photonic Probes of Surfaces, edited by P. Halevi (North Holland Elsevier, Amsterdam, 1995).
    • (1995) Photonic Probes of Surfaces
    • Pickering, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.