-
1
-
-
36549097538
-
-
H. Temkin, T. P. Pearsall, J. C. Bean, R. A. Logan, and S. Luryi, Appl. Phys. Lett. 48, 963 (1986); S. Luryi, A. Kastalsky, and J. C. Bean, IEEE Trans. Electron Devices 31, 1135 (1984).
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 963
-
-
Temkin, H.1
Pearsall, T.P.2
Bean, J.C.3
Logan, R.A.4
Luryi, S.5
-
2
-
-
0021482580
-
-
H. Temkin, T. P. Pearsall, J. C. Bean, R. A. Logan, and S. Luryi, Appl. Phys. Lett. 48, 963 (1986); S. Luryi, A. Kastalsky, and J. C. Bean, IEEE Trans. Electron Devices 31, 1135 (1984).
-
(1984)
IEEE Trans. Electron Devices
, vol.31
, pp. 1135
-
-
Luryi, S.1
Kastalsky, A.2
Bean, J.C.3
-
3
-
-
0000625970
-
-
G. Capellini, L. Di Caspare, F. Evangelisti, and E. Palange, Appl. Phys. Lett. 70, 493 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 493
-
-
Capellini, G.1
Di Caspare, L.2
Evangelisti, F.3
Palange, E.4
-
5
-
-
0001699411
-
-
M. Goryll, L. Vescan, K. Schmidt, S. Mesters, H. Lüth, and K. Szot, Appl. Phys. Lett. 70, 410 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 410
-
-
Goryll, M.1
Vescan, L.2
Schmidt, K.3
Mesters, S.4
Lüth, H.5
Szot, K.6
-
8
-
-
0000867690
-
-
Y. D. Kim, S. G. Choi, M. V. Klein, S. D. Yoo, D. E. Aspens, S. H. Xin, and J. K. Furdyna, Appl. Phys. Lett. 70, 610 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 610
-
-
Kim, Y.D.1
Choi, S.G.2
Klein, M.V.3
Yoo, S.D.4
Aspens, D.E.5
Xin, S.H.6
Furdyna, J.K.7
-
9
-
-
0005840859
-
-
E. Franke, H. Neumann, M. Schubert, T. E. Tiwald, J. A. Woollam, and J. Hahn, Appl. Phys. Lett. 70, 1668 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 1668
-
-
Franke, E.1
Neumann, H.2
Schubert, M.3
Tiwald, T.E.4
Woollam, J.A.5
Hahn, J.6
-
10
-
-
0001631863
-
-
A. Borghesi, M. E. Giardini, M. Marazzi, A. Sassella, and G. De Santi, Appl. Phys. Lett. 70, 892 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 892
-
-
Borghesi, A.1
Giardini, M.E.2
Marazzi, M.3
Sassella, A.4
De Santi, G.5
-
11
-
-
0000376445
-
-
S. J. Fang, W. Chen, T. Yamanaka, and C. R. Helms, Appl. Phys. Lett. 68, 2837 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2837
-
-
Fang, S.J.1
Chen, W.2
Yamanaka, T.3
Helms, C.R.4
-
14
-
-
3643073222
-
Ellipsometry and Light Scattering Characterization of Semiconductor Surfaces
-
edited by P. Halevi North Holland Elsevier, Amsterdam
-
C. Pickering, Ellipsometry and Light Scattering Characterization of Semiconductor Surfaces in Photonic Probes of Surfaces, edited by P. Halevi (North Holland Elsevier, Amsterdam, 1995).
-
(1995)
Photonic Probes of Surfaces
-
-
Pickering, C.1
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