Spectroscopic ellipsometry of germanium growth on hydrogen-terminated silicon (111)

Applied Physics Letters

Volumn 69, Issue 12, 1996, Pages 1740-1742

  Barth, Michael ^a   Hess, Peter ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345411034     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117470     Document Type: Article

References (10)

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