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Volumn 96, Issue 10, 2004, Pages 5588-5595

Structural and electrical characterization of AuPdAlTi ohmic contacts to AlGaN/GaN with varying Ti content

(11) Fay, M W a Moldovan, G a,c Weston, N J a Brown, P D a Harrison, I a Hilton, K P b Masterton, A b Wallis, D b Balmer, R S b Uren, M J b Martin, T b

a UNIVERSITY OF NOTTINGHAM (United Kingdom)

b QINETIQ (United Kingdom)

c UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTRON MICROSCOPY; FIELD EFFECT TRANSISTORS; GALLIUM NITRIDE; GOLD COMPOUNDS; HETEROJUNCTIONS; RAPID THERMAL ANNEALING; SEMICONDUCTING ALUMINUM COMPOUNDS; THERMODYNAMIC STABILITY; TITANIUM;

CONTACT RESISTANCE; ELECTRICAL CHARACTERIZATION; MECHANICAL STABILITY; MELTS;

OHMIC CONTACTS;

EID: 9944253861 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1796514 Document Type: Article

Times cited : (42)

References (13)

1
- 21544457842
- M. E. Lin, Z. Ma, F. Y. Huang, Z. F. Fan, L. H. Allen, and H. Morkoç, Appl. Phys. Lett. 64, 1003 (1994).
- (1994) Appl. Phys. Lett. , vol.64 , pp. 1003
- Lin, M.E.¹ Ma, Z.² Huang, F.Y.³ Fan, Z.F.⁴ Allen, L.H.⁵ Morkoç, H.⁶

2
- 5644259934
- S. Ruvimov et al., Appl. Phys. Lett. 69, 1556 (1996).
- (1996) Appl. Phys. Lett. , vol.69 , pp. 1556
- Ruvimov, S.¹

3
- 0034227948
- J. S. Kwak, S. E. Mohney, J.-Y. Lin, and R. S. Kern, Semicond. Sci. Technol. 15, 756 (2000).
- (2000) Semicond. Sci. Technol. , vol.15 , pp. 756
- Kwak, J.S.¹ Mohney, S.E.² Lin, J.-Y.³ Kern, R.S.⁴

4
- 0036607903
- J. K. Kim, H. W. Jang, and J. L. Lee, J. Appl. Phys. 91, 9214 (2002).
- (2002) J. Appl. Phys. , vol.91 , pp. 9214
- Kim, J.K.¹ Jang, H.W.² Lee, J.L.³

5
- 0042341744
- C. J. Lu, A. V. Davydov, D. Josell, and L. A. Bendersky, J. Appl. Phys. 94, 245 (2003).
- (2003) J. Appl. Phys. , vol.94 , pp. 245
- Lu, C.J.¹ Davydov, A.V.² Josell, D.³ Bendersky, L.A.⁴

6
- 0742285731
- Y. J. Lin, Y. M. Chen, T. J. Cheng, and Q. Ker, J. Appl. Phys. 95, 571 (2004).
- (2004) J. Appl. Phys. , vol.95 , pp. 571
- Lin, Y.J.¹ Chen, Y.M.² Cheng, T.J.³ Ker, Q.⁴

7
- 0001076210
- C. T. Lee and H. W. Kao, Appl. Phys. Lett. 76, 2364 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 2364
- Lee, C.T.¹ Kao, H.W.²

8
- 3442882603
- Z. F. Fan, S. N. Mohammad, W. Kim, O. Aktas, A. E. Botchkarev, and H. Morkoç, Appl. Phys. Lett. 68, 1672 (1996).
- (1996) Appl. Phys. Lett. , vol.68 , pp. 1672
- Fan, Z.F.¹ Mohammad, S.N.² Kim, W.³ Aktas, O.⁴ Botchkarev, A.E.⁵ Morkoç, H.⁶

9
- 0032202916
- S. J. Cai, R. Li, Y. L. Chen, L. Wong, W. G. Wu, S. G. Thomas, K. L. Wang, Electron. Lett. 34, 2354 (1998).
- (1998) Electron. Lett. , vol.34 , pp. 2354
- Cai, S.J.¹ Li, R.² Chen, Y.L.³ Wong, L.⁴ Wu, W.G.⁵ Thomas, S.G.⁶ Wang, K.L.⁷

10
- 0030565356
- S. N. Mohammad, Z. F. Fan, A. Salvador, O. Aktas, A. E. Botchkarev, W. Kim, and H. Morkoç, Appl. Phys. Lett. 69, 1420 (1996).
- (1996) Appl. Phys. Lett. , vol.69 , pp. 1420
- Mohammad, S.N.¹ Fan, Z.F.² Salvador, A.³ Aktas, O.⁴ Botchkarev, A.E.⁵ Kim, W.⁶ Morkoç, H.⁷

11
- 0035423505
- E. F. Chor, D. Zhang, H. Gong, G. L. Chen, and T. Y. F. Liew, J. Appl. Phys. 90, 1242 (2001).
- (2001) J. Appl. Phys. , vol.90 , pp. 1242
- Chor, E.F.¹ Zhang, D.² Gong, H.³ Chen, G.L.⁴ Liew, T.Y.F.⁵

12
- 0035868111
- A. N. Bright, P. J. Thomas, M. Weyland, D. M. Tricker, C. J. Humphreys, and R. Davies, J. Appl. Phys. 89, 3143 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 3143
- Bright, A.N.¹ Thomas, P.J.² Weyland, M.³ Tricker, D.M.⁴ Humphreys, C.J.⁵ Davies, R.⁶

13
- 0036639522
- M. W. Fay, G. Moldovan, P. D. Brown, I. Harrison, J. C. Birbeck, B. T. Hughes, M. J. Uren, and T. Martin, J. Appl. Phys. 92, 94 (2002).
- (2002) J. Appl. Phys. , vol.92 , pp. 94
- Fay, M.W.¹ Moldovan, G.² Brown, P.D.³ Harrison, I.⁴ Birbeck, J.C.⁵ Hughes, B.T.⁶ Uren, M.J.⁷ Martin, T.⁸

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