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Volumn 68, Issue 12, 1996, Pages 1672-1674

Very low resistance multilayer Ohmic contact to n-GaN

Author keywords

[No Author keywords available]

Indexed keywords


EID: 3442882603     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115901     Document Type: Article
Times cited : (428)

References (12)
  • 1
    • 0029388336 scopus 로고    scopus 로고
    • For a recent review of issues germane to GaN-based devices see, S. N. Mohammad, A. Salvador, and H. Morkoç, Proc. IEEE 83, 1306 (1995)
    • For a recent review of issues germane to GaN-based devices see, S. N. Mohammad, A. Salvador, and H. Morkoç, Proc. IEEE 83, 1306 (1995).
  • 2
    • 22244449082 scopus 로고    scopus 로고
    • Ö. Aktas, W. Kim, Z. Fan, A. Botchkarev, A. Salvador, S. N. Mohammad, B. Sverdlov, and H. Morkoç, Electron Lett. (in press); M. A. Khan, M. S. Shur, J. N. Kuznia, Q. Chen, J. Burm, and W. Schaff, Appl. Phys. Lett. 66, 1083 (1995); S. C. Binari, L. B. Rowland, W. Kruppa, G. Kelner, K. Doverspike, and D. K. Gaskill, Electron. Lett. 30, 1248 (1994); S. N. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994)
    • Ö. Aktas, W. Kim, Z. Fan, A. Botchkarev, A. Salvador, S. N. Mohammad, B. Sverdlov, and H. Morkoç, Electron Lett. (in press); M. A. Khan, M. S. Shur, J. N. Kuznia, Q. Chen, J. Burm, and W. Schaff, Appl. Phys. Lett. 66, 1083 (1995); S. C. Binari, L. B. Rowland, W. Kruppa, G. Kelner, K. Doverspike, and D. K. Gaskill, Electron. Lett. 30, 1248 (1994); S. N. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994).
  • 5
    • 22244483881 scopus 로고    scopus 로고
    • Y. Wu, W. Jiang, B. Keller, S. Keller, D. Kapolnek, S. Denbaars, and U. Mishra, Topical Workshop on III-V Nitrides Proceedings, Nagoya, Japan, 1995
    • Y. Wu, W. Jiang, B. Keller, S. Keller, D. Kapolnek, S. Denbaars, and U. Mishra, Topical Workshop on III-V Nitrides Proceedings, Nagoya, Japan, 1995.
  • 10
    • 0028737476 scopus 로고    scopus 로고
    • I. S. Park, S. I. Lee, Y. J. Wee, W. S. Jung, G. H. Choi, C. S. Park, S. H. Park, S. T. Ahn, M. Y. Lee, Y. K. Kim, and R. Reynolds, International Electron Devices Meeting Technical Digest (Institution of Electrical and Electronic Engineers, Piscataway, NJ, 1994), p. 109
    • I. S. Park, S. I. Lee, Y. J. Wee, W. S. Jung, G. H. Choi, C. S. Park, S. H. Park, S. T. Ahn, M. Y. Lee, Y. K. Kim, and R. Reynolds, International Electron Devices Meeting Technical Digest (Institution of Electrical and Electronic Engineers, Piscataway, NJ, 1994), p. 109.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.