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Volumn 16, Issue 46, 2004, Pages 8409-8419

Positron lifetime studies on 8 MeV electron-irradiated n-type 6H silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; ELECTRON IRRADIATION; ENERGY GAP; HIGH TEMPERATURE EFFECTS; IONIZATION; POSITRONS; SEMICONDUCTOR MATERIALS;

EID: 9944221018     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/46/026     Document Type: Article
Times cited : (5)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.