Defect characterization in electron-irradiated (formula presented) by positron annihilation

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 16, 1999, Pages 10603-10606

  Polity, A ^a   Huth, S ^a   Lausmann, M ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000490933     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.10603     Document Type: Article

References (26)

1. G. Pensl and R. Helbig, in Advances in Solid State Physics, edited by U. Rössler (Viehweg, Braunschweig, 1990), Vol. 30, p. 133.
2. W. J. Choyke and L. Patrick, Phys. Rev. B4, 1843 (1971).
3. L. Patrick and W J. Choyke, J. Phys. Chem. Solids34, 565 (1973).
4. W. J. Choyke and L. Patrick, Phys. Rev. B2, 4959 (1970).
5. L. A. de S. Balona and J H N. Loubser, J. Phys. C3, 2344 (1970).
6. H. Itoh, N. Hayakawa, I. Nashiyama, and E. Sakuma, J. Appl. Phys.66, 4529 (1989).
7. H. Zhang, G. Pensl, A. Dömen, and S. Leibenzeder, ECS, Hollywood, Extended Abstracts89-2, 699 (1989).
8. V. S. Ballandovich and G N. Violina, Cryst. Lattice Defects Amorphous Mater.13, 189 (1987).
9. T. Dalibor, G. Pensl, H. Matsunami, T. Kimoto, W. Choyoke, A. Schöner, and N. Nordell, Phys. Status Solidi A162, 199 (1997).
10. R. Krause-Rehberg and H S. Leipner, Solid-State Sciences (Springer-Verlag, Heidelberg, 1999).
11. A. I. Girka, V A. Kuleshin, A D. Mokrushin, E N. Mokhov, S V. Svirida, and A V. Shishkin, Fiz. Tekh. Poluprovodn. 23, 2159 (1989) [Sov. Phys. Semicond.23, 1337 (1989)].
12. A. A. Rempel and H E. Schäfer, Appl. Phys. A: Mater. Sci. Process.61, 51 (1995).
13. A. A. Rempel, H E. Schäfer, M. Forster, andA I. Girka, in Covalent Ceramics II: Non-Oxides, edited by A. R. Barron, et al.MRS Symposia Proceedings No. 327 (Materials Research Society, Pittsburgh, 1994), p. 299.
14. A. Kawasuso, H. Itoh, and S. Okada, J. Appl. Phys.80, 5639 (1996).
15. W. Puff, M. Boumerzoug, J. Brown, P. Mascher, D. Macdonald, P J. Simpson, A G. Balogh, H. Hahn, W. Chang, and M. Rose, Appl. Phys. A: Mater. Sci. Process.61, 55 (1995).
16. S. Dannefaer, Appl. Phys. A: Mater. Sci. Process.61, 59 (1995).
17. S. Dannefaer, D. Craigen, and D. Kerr, Phys. Rev. B51, 1928 (1995).
18. M. Bertolocciani, A. Bisi, G. Gambari, and L. Zappa, J. Phys. C4, 734 (1971).
19. W. Brandt, Appl. Phys.5, 1 (1974).
20. M. J. Puska and R M. Nieminen, Rev. Mod. Phys.66, 841 (1994).
21. B. Somieski, T E M. Staab, and R. Krause-Rehberg, Nucl. Instrum. Methods Phys. Res. A381, 128 (1996).
22. T.E.M. Staab, B. Somieski, and R. Krause-Rehberg, Nucl. Instrum. Methods Phys. Res. A381, 141 (1996).
23. G. Brauer, W. Anwand, E M. Nicht, J. Kuriplach, M. Sob, N. Wagner, P G. Coleman, M J. Puska, and T. Korhonen, Phys. Rev. B54, 2512 (1996).
24. G. Brauer, W. Anwand, P G. Coleman, A P. Knights, F. Plazaola, Y. Pacaud, W. Skorupa, J. Störmer, and P. Willutzki, Phys. Rev. B54, 3084 (1996).
25. H. Itoh, M. Yoshikawa, I. Nashiyama, S. Misawa, H. Okumura, and S. Yoshida, J. Electron. Mater.21, 707 (1992).
26. J. Schneider and K. Maier, Physica B185, 199 (1993).