Write endurance in flash drives: Measurements and analysis

Proceedings of FAST 2010: 8th USENIX Conference on File and Storage Technologies

Volumn , Issue , 2010, Pages 115-128

  Boboila, Simona ^a   Desnoyers, Peter ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEVEL MEASUREMENT; REVERSE ENGINEERING;

ACCESS PATTERNS; ENDURANCE TESTING; FLASH TRANSLATION LAYER; ON-LINE ALGORITHMS; TIMING ANALYSIS; UNDERLYING FACTORS; USB FLASH DRIVES; WRITE ENDURANCES;

MONTE CARLO METHODS;

EID: 85077066106     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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