Characterization of polymer thin films with small‐angle X‐ray scattering under grazing incidence (GISAXS)

Synchrotron Radiation News

Volumn 15, Issue 5, 2002, Pages 35-42

  Smilgies, Detlef‐M ^a   Busch, Peter ^b   Papadakis, Christine M ^b   Posselt, Dorthe ^c  

^a Cornell University ^*  (United States)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c ROSKILDE UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85070135789     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940880208602975     Document Type: Note

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