Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods

Thin Solid Films

Volumn 336, Issue 1-2, 1998, Pages 1-8

  Metzger, T H ^a   Kegel, I ^a   Paniago, R ^a,b   Lorke, A ^a   Peisl, J ^a   Schulze, J ^c   Eisele, I ^c   Schittenhelm, P ^d   Abstreiter, G ^d  

^a UNIVERSITY OF MUNICH   (Germany)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c BUNDESWEHR UNIVERSITY MUNICH   (Germany)

^d WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

Quantum dots; Self assembled growth; Semiconductor nanostructures; X ray scattering

Indexed keywords

CORRELATION METHODS; HETEROJUNCTIONS; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SEMICONDUCTOR SUPERLATTICES; SYNCHROTRON RADIATION; X RAY SCATTERING;

GRAZING INCIDENCE X RAY SCATTERING METHODS; QUANTUM CONFINEMENT EFFECTS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0032313257     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01290-5     Document Type: Article

References (12)

1. MRS Bulletin, 23(2), February 1998.
2. A.A. Darhuber, et-al., Phys. Rev. B 55 (1997) 15652.
3. U. Pietsch, H. Metzger, S. Rugel, B. Jennichen, I.K. Robinson, J. Appl. Phys. 74 (1993) 2381.
4. K. Paschke, et-al., Appl. Phys. Lett. 70 (1997) 1031.
5. T. Salditt, T. H. Metzger, J. Peisl, Phys. Rev. Lett. 73 (1994) 2228.
6. D. Leonard, K. Pond, P.M. Petroff, Phys. Rev. B 50 (1994) 11689.
7. I. Kegel, et al. Proc. MRS Spring Meeting (1998) in press.
8. Y.-W. Mo, D.E. Savage, B.S. Swartzentruber, M.G. Lagally, Phys. Rev. Lett. 65 (1990) 1020.
9. A.J. Steinfort, et-al., Phys. Rev. Lett. 77 (1996) 2009.
10. A.A. Williams, et-al., Phys. Rev. B 51 (1995) 5617.
11. I. Kegel, et al. Appl. Phys. Lett. (1998) submitted.
12. T. Salditt, T.H. Metzger, J. Peisl, Phys. Rev. Lett. 73 (1994) 2228.