Direct observation of localized surface plasmon field enhancement by Kelvin probe force microscopy

Light: Science and Applications

Volumn 6, Issue 8, 2017, Pages

  Li, Da Bing ^a   Sun, Xiao Juan ^a   Jia, Yu Ping ^a   Stockman, Mark I ^b   Paudel, Hari P ^b   Song, Hang ^a   Jiang, Hong ^a   Li, Zhi Ming ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b GEORGIA STATE UNIVERSITY   (United States)

Author keywords

Detector; GaN; KPFM; Plasmon

Indexed keywords

DETECTORS; EPILAYERS; EXCITED STATES; GALLIUM NITRIDE; METAL NANOPARTICLES; NANOPARTICLES; NANOSTRUCTURES; OPTOELECTRONIC DEVICES; PLASMONS; PROBES; SURFACE POTENTIAL;

ENHANCEMENT EFFECTS; EXPERIMENTAL EVIDENCE; KELVIN PROBE FORCE MICROSCOPY; KPFM; LOCALIZED SURFACE PLASMON; PHOTOGENERATED ELECTRONS; POTENTIAL REDUCTION; ULTRAVIOLET ILLUMINATION;

SILVER;

EID: 85028066486     PISSN: 20955545     EISSN: 20477538     Source Type: Journal    
DOI: 10.1038/lsa.2017.38     Document Type: Article

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