Non-destructive experimental investigation about RBSOA in high power IGBT modules

2008 5th International Conference on Integrated Power Systems, CIPS 2008

Volumn , Issue , 2008, Pages

  Busatto, Giovanni ^a   Abbate, Carmine ^a   Abbate, Benedetto ^a   Iannuzzo, Francesco ^a  

^a UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

NONDESTRUCTIVE EXAMINATION;

EXPERIMENTAL ANALYSIS; EXPERIMENTAL CHARACTERIZATION; EXPERIMENTAL INVESTIGATIONS; HIGH PERFORMANCE DEVICES; JUNCTION TEMPERATURES; NON-DESTRUCTIVE TEST; POWER ELECTRONIC SYSTEMS; PROTECTION CIRCUITS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 84991236055     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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2. Busatto G., Abbate C., Cascone B., Manzo R., Fratelli L., Giannini G., Iannuzzo F., Velardi F. "Characterisation of High-Voltage IGBT Modules at High Temperature and High Currents", PEDS Conference, Singapore 2003.
3. Chen D.Y., Lee F.C., Carpenter G. "Nondestructive RBSOA Characterization of IGBT's and MCT's," IEEE Transactions on Power Electronics vol.10, pp. 368-372, N.3, 1995.
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9. A. Castellazzi, M. Ciappa, W. Fichtner, G. Lourdel, M. Mermet-G "Comprehensive Electro-Thermal Compact Model of a 3.3kV-1200A IGBT-module" powering 2007, pp. 405-410.
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