-
1
-
-
0032310013
-
Further improvements in the reliability of IGBT modules
-
St. Louis, U.S.A
-
Schutze T, Berg H., Hierholzer M. "Further Improvements in the Reliability of IGBT Modules." IEEE Industry Application Society Conference, vol.2, pp. 1022-1025, St. Louis, U.S.A., 1998.
-
(1998)
IEEE Industry Application Society Conference
, vol.2
, pp. 1022-1025
-
-
Schutze, T.1
Berg, H.2
Hierholzer, M.3
-
2
-
-
8744284963
-
nd Generation of I200A 3300V HVIGBT Module
-
Nuernberg, Germany
-
Matsumoto H., Takeda M, Ishii K, Thai E, Lecoq F. "2nd Generation of I200A 3300V HVIGBT Module, " International Conference on Power Conversion Intelligent Motion (PCIM), Nuernberg, Germany, 1999.
-
(1999)
International Conference on Power Conversion Intelligent Motion (PCIM)
-
-
Matsumoto, H.1
Takeda, M.2
Ishii, K.3
Thai, E.4
Lecoq, F.5
-
4
-
-
0032630961
-
Analysis of CIC NPT IGBT's turn OFF operations for high switching current level
-
Lefebvre S, Miserey F. "Analysis ofCIC NPT IGBT's Turn OFF operations for High Switching Current Level, " IEEE Transactions on Electron Devices vol.46, pp. 1042-1049, No.5, 1999.
-
(1999)
IEEE Transactions on Electron Devices
, vol.46
, Issue.5
, pp. 1042-1049
-
-
Lefebvre, S.1
Miserey, F.2
-
5
-
-
84885541949
-
Non-destructive RBSOA characterization of IGBT's and MCT's
-
Chen D.Y., Lee F.C., Carpenter G. "Non-destructive RBSOA Characterization of IGBT's and MCT's, " IEEE Transactions on Power Electronics vol. 10, pp. 368-372, No.3, 1995.
-
(1995)
IEEE Transactions on Power Electronics
, vol.10
, Issue.3
, pp. 368-372
-
-
Chen, D.Y.1
Lee, F.C.2
Carpenter, G.3
-
6
-
-
0031673050
-
Investigation of the short-circuit performance of an IGBT
-
Trivedi M., Shenai K. " Investigation of the Short-Circuit Performance of an IGBT, " IEEE Transactions oil Electron Devices vol.45, pp. 313-320, No.l, 1998.
-
(1998)
IEEE Transactions Oil Electron Devices
, vol.45
, Issue.1
, pp. 313-320
-
-
Trivedi, M.1
Shenai, K.2
-
7
-
-
0031646746
-
Transient temperature measurements and modeling of IGBT's under short circuit
-
Ammous A., Allard B., Morel H. "Transient Temperature Measurements and Modeling of IGBT's Under Short Circuit, " IEEE Transactions on Power Electronics, vol.13, pp. 12-25, No.l, .
-
IEEE Transactions on Power Electronics
, vol.13
, Issue.1
, pp. 12-25
-
-
Ammous, A.1
Allard, B.2
Morel, H.3
-
8
-
-
0032777935
-
Failure mechanisms of IGBT's under short-circuit and clamped inductive switching stress
-
Trivedi M Shenai K. "Failure Mechanisms of IGBT's Under Short-Circuit and Clamped Inductive Switching Stress, " IEEE Transactions on Power Electronics, vol. 14, pp. 108-116, No.1, 1999.
-
(1999)
IEEE Transactions on Power Electronics
, vol.14
, Issue.1
, pp. 108-116
-
-
Trivedi, M.S.K.1
-
9
-
-
0006951718
-
Muitichip high power IGBT modules for traction and industrial application
-
Trondheim
-
Sommer K., Goettert J., Lefntnc G,, Spanke R. "Muitichip High Power IGBT modules for traction and industrial Application, " European Power Electronics Conference, vol.1, pp. 112-116, Trondheim, 1997.
-
(1997)
European Power Electronics Conference
, vol.1
, pp. 112-116
-
-
Sommer, K.1
Goettert, J.2
Lefntnc, G.3
Spanke, R.4
-
10
-
-
8744276949
-
Non-destructive high temperature characterisation of high voltage IGBTs
-
October
-
Busatto G, Cascone B., Fratelli L., Balsamo M., lannuzzo F, Velardi F. "Non-destructive high temperature characterisation of high voltage IGBTs." Microelectronics Reliability, Vol. 42, pp.1635-1640, October 2002.
-
(2002)
Microelectronics Reliability
, vol.42
, pp. 1635-1640
-
-
Busatto, G.1
Cascone, B.2
Fratelli, L.3
Balsamo, M.4
Lannuzzo, F.5
Velardi, F.6
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