The structure and properties of amorphous indium oxide

Chemistry of Materials

Volumn 26, Issue 18, 2014, Pages 5401-5411

  Buchholz, D Bruce ^a   Ma, Qing ^b   Alducin, Diego ^c   Ponce, Arturo ^c   Jose Yacaman, Miguel ^c   Khanal, Rabi ^d   Medvedeva, Julia E ^d   Chang, Robert P H ^a  

^a Northwestern University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF TEXAS AT SAN ANTONIO   (United States)

^d MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; FILM GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MOLECULAR DYNAMICS; PULSED LASER DEPOSITION; SILICA; X RAY ABSORPTION; X RAY DIFFRACTION;

AB INITIO MOLECULAR DYNAMICS; AMORPHOUS INDIUM-OXIDE; AMORPHOUS SILICA; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; GRAZING ANGLE X-RAY DIFFRACTION; STRUCTURE AND PROPERTIES; STRUCTURE PROPERTY RELATIONSHIPS; TRANSPORT MEASUREMENTS;

INDIUM COMPOUNDS;

EID: 84990842364     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm502689x     Document Type: Article

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