Electron beam induced growth of tin whiskers

Journal of Applied Physics

Volumn 118, Issue 12, 2015, Pages

  Vasko, A C ^a   Warrell, G R ^b   Parsai, E I ^b   Karpov, V G ^a   Shvydka, Diana ^b  

^a UNIVERSITY OF TOLEDO   (United States)

^b MEDICAL COLLEGE OF OHIO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL WHISKERS; ELECTRON BEAMS; ELECTRON IRRADIATION; NORMAL DISTRIBUTION; TESTING;

ACCELERATED LIFE TESTING; CONTROL SAMPLES; ELECTROSTATIC EFFECT; INSULATING SUBSTRATES; LOG-NORMAL DISTRIBUTION; MEV ENERGY; TIN WHISKER; WHISKER GROWTH;

TIN;

EID: 84978247436     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4931426     Document Type: Article

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