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Volumn 99, Issue 11, 2006, Pages

Electron beam charging of insulators: A self-consistent flight-drift model

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON AND HOLE DRIFTS; ELECTRON BEAM IRRADIATION; FLIGHT-DRIFT MODEL; POOLE-FRENKEL-TYPE TEMPERATURE;

EID: 33745249947     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2201851     Document Type: Article
Times cited : (109)

References (52)
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    • Fourth International Conference on Electric Charges in Non-Conductive Materials, Le Vide: Science, Techniques et Applications, Vol. Special CSC'4
    • Fourth International Conference on Electric Charges in Non-Conductive Materials, Le Vide: Science, Techniques et Applications, Vol. Special CSC'4, 2001.
    • (2001)
  • 6
    • 25944437868 scopus 로고    scopus 로고
    • Toulouse, France
    • L. Levy, Material Charging, Cedapus ed. (Toulouse, France, 2002), pp. 241-266.
    • (2002) Material Charging , pp. 241-266
    • Levy, L.1
  • 17
    • 33745231869 scopus 로고
    • University of Rostock
    • H.-J. Fitting, Habilitation thesis, University of Rostock, 1978.
    • (1978)
    • Fitting, H.-J.1
  • 27
    • 33745256544 scopus 로고    scopus 로고
    • Ph.D. thesis, Ecole Superieure des Mines de Saint-Etienne
    • X. Meyza, Ph.D. thesis, Ecole Superieure des Mines de Saint-Etienne, 2003.
    • (2003)
    • Meyza, X.1
  • 44
    • 0242359352 scopus 로고
    • Proceedings of the Conference on Radiation Effects and Tritium Technology for Fusion Reactors, edited by J. S.Watson, F. W.Wiffen, I. L.Bishop, and B. K.Breeden Gatlinburg, TN
    • V. A. J. Van Lint, J. M. Bunch, and T. M. Flanagan, Proceedings of the Conference on Radiation Effects and Tritium Technology for Fusion Reactors, edited by, J. S. Watson, F. W. Wiffen, I. L. Bishop, and, B. K. Breeden, Gatlinburg, TN, 1976, Vol. 11, p. 531.
    • (1976) , vol.11 , pp. 531
    • Van Lint, V.A.J.1    Bunch, J.M.2    Flanagan, T.M.3
  • 52
    • 0003521686 scopus 로고    scopus 로고
    • Springer Series in Optical Sciences Vol 2nd Edition (Springer, Berlin, Heidelberg, New York
    • L. Reimer, Scanning Electron Microscopy, Physics of Image Formation and Microanalysis, Springer Series in Optical Sciences Vol 45, 2nd Edition (Springer, Berlin, Heidelberg, New York, 1998), Chap. 3.5.2.
    • (1998) Physics of Image Formation and Microanalysis , vol.45
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.