Statistical analysis of tin whisker growth

Microelectronics Reliability

Volumn 46, Issue 5-6, 2006, Pages 846-849

  Fang, Tong ^a   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRASS; CRYSTAL GROWTH; LEAD ALLOYS; LEAKAGE CURRENTS; SEMICONDUCTOR MATERIALS; SHORT CIRCUIT CURRENTS; STATISTICAL METHODS; TIN ALLOYS;

BRASS SUBSTRATES; CONDUCTIVE TIN WHISKERS; WHISKER GROWTH;

CRYSTAL WHISKERS;

EID: 33645136360     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.06.002     Document Type: Conference Paper

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