Electrostatic fields and current-flow impact on whisker growth

IEEE Transactions on Electronics Packaging Manufacturing

Volumn 28, Issue 1, 2005, Pages 75-84

  Hilty, Robert D ^a   Corman, Ned E ^a   Herrmann, Hank ^a  

^a Tyco Electronics   (United States)

Author keywords

Electrostatic; Lead free; Tin; Whisker

Indexed keywords

CRYSTAL GROWTH; CURRENT DENSITY; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRON DEVICES; ELECTROSTATICS; LEAD; SHORT CIRCUIT CURRENTS; TIN; TINNING;

TIN WHISKERS; WHISKER GROWTH;

CRYSTAL WHISKERS;

EID: 20344396368     PISSN: 1521334X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEPM.2005.847814     Document Type: Article

References (16)

1. D. W. Romm et al., "Whisker Evaluation of Tin-Plated Logic Component Leads," Texas Instruments, Application report SZZA037A, 2003.
2. J. Smetana and Alcatel, personal communication, Jun. 2004.
3. P. Oberndorff and Philips, personal communication, Jun. 2004.
4. M. Ishii et al., "Whisker problem in the ultra fine pitch circuits," in Proc. 12th Eur. Microelectronics Packaging Conf., Jun. 1999, p. 379.
5. J. W. Osenbach et al., "The effects of board attachment processing on Sn whisker formation on electroplated matte-Sn on Cu alloy lead frames," in Proc. IPC Conf. Lead Free Electronics, San Jose, CA, 2004.
6. J. Brusse et al., "Tin whiskers: Attributes and mitigation," in Proc. CARTS, Mar. 25-29, 2002, p. 67.
7. B. D. Dunn, "Mechanical and electrical characteristics of tin whiskers with special reference to spacecraft systems," ESA J., vol. 12, pp. 1-17, Jan. 1988.
8. Ansoft 3D Field Simulator Version 4, Pittsburgh, PA.
9. B. D. Dunn, "Mechanical and electrical characteristics of tin whiskers with special reference to spacecraft systems," ESA J., vol. 12, pp. 1-17, Jan. 1988.
10. H. Höft, "Contribution to the calculation of arc breakdown voltage," in Proc. 11th Int. Conf. Electric Contact Phenomena, Germany, 1982, pp. 383-386.
11. C. Iacobaeus et al., (2001) Sporadic Electron Jets from Cathodes - The Main Breakdown-Triggering Mechanism in Gaseous Detectors. Karolinska Institutet, Stockholm, Sweden. [Online]. Available: http://arxiv.org/ftp/ physics/papers/0112/011213.pdf
12. G. N. Fursey, "Field emission and vacuum breakdown," IEEE Trans. Electr. Insul., vol. EI-20, no. 4, pp. 659-670, Aug. 1985.
13. P. G. Slade and E. D. Taylor, "Electrical breakdown in atmospheric air between closely spaced (0.2 μm-40 μm) electrical contacts," in Proc. 47th IEEE Holm Conf. Electrical Contacts, Montreal, QC, Canada, Sep. 2001, pp. 245-250.
14. D. Brooks, "Fusing Current: When Traces Melt Without a Trace," Printed Circuit Board Design, vol. 15, no. 12, Dec. 1998.
15. D. Brooks, "Fusing Current: When Traces Melt Without a Trace," Printed Circuit Board Design, vol. 15, no. 12, Dec. 1998.
16. Y. Hada et al., "Study of tin whiskers on electromagnetic relay parts," in Proc. 26th National Relay Conf., Apr. 1978, pp. 9.1-9.15.