A pnCCD-based, fast direct single electron imaging camera for TEM and STEM

Journal of Instrumentation

Volumn 11, Issue 4, 2016, Pages

  Ryll, H ^a   Simson, M ^b   Hartmann, R ^a   Holl, P ^a   Huth, M ^b   Ihle, S ^b   Kondo, Y ^c   Kotula, P ^d   Liebel, A ^b   Muller Caspary K ^e   Rosenauer, A ^e   Sagawa, R ^c   Schmidt, J ^b   Soltau, H ^b   Struder L ^a,f  

^a PNSENSOR GMBH   (Germany)

^b PNDETECTOR GMBH   (Germany)

^c JEOL LTD   (Japan)

^d SANDIA NATIONAL LABORATORIES   (United States)

^e UNIVERSITY OF BREMEN   (Germany)

^f UNIVERSITY OF SIEGEN   (Germany)

Author keywords

Pixelated detectors and associated VLSI electronics; Radiation hard detectors; Solid state detectors; Very low energy charged particle detectors

Indexed keywords

BINS; CAMERAS; CHARGED PARTICLES; DIFFRACTION; ELECTRON MICROSCOPY; HARDNESS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC DOMAINS; PIXELS; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DETECTORS; TRANSMISSION ELECTRON MICROSCOPY;

EXPERIMENTAL REQUIREMENTS; MICROSCOPY TECHNIQUE; RADIATION HARD DETECTORS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR NANOSTRUCTURES; SOLID STATE DETECTORS; TWO DIMENSIONAL IMAGES; VLSI ELECTRONICS;

ELECTRONS;

EID: 84962909900     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/11/04/P04006     Document Type: Article

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