SCOPUS 정보 검색 플랫폼

IEEE Nuclear Science Symposium Conference Record

Volumn , Issue , 2011, Pages 1946-1949

Fast, radiation hard, direct detection CMOS imagers for high resolution Transmission Electron Microscopy

(7) Krieger, Brad a Contarato, Devis a Denes, Peter a Doering, Dionisio a Gnani, Dario a Joseph, John a Schindler, Simon a

a LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; MEDICAL IMAGING; PIXELS;

DESIGN CHALLENGES; DIRECT DETECTION; ELECTRON DETECTORS; IMAGING PERFORMANCE; MONOLITHIC PIXEL SENSOR; PIXEL ARCHITECTURES; PROTOTYPE SENSOR; RADIATION HARDNESS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84858684374 PISSN: 10957863 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/NSSMIC.2011.6154391 Document Type: Conference Paper

Times cited : (9)

References (8)

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2
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3
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4
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- A rad-hard CMOS active pixel sensor for electron microscopy
- 11 January
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8
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