STEM strain analysis at sub-nanometre scale using millisecond frames from a direct electron read-out CCD camera

Journal of Physics: Conference Series

Volumn 471, Issue 1, 2013, Pages

  Muller K ^a   Ryll, H ^b   Ordavo, I ^b   Schowalter, M ^a   Zweck, J ^c   Soltau, H ^b   Ihle, S ^d   Struder L ^d   Volz, K ^e   Potapov, P ^f   Rosenauer, A ^a  

^a UNIVERSITY OF BREMEN   (Germany)

^b PNSENSOR GMBH   (Germany)

^c UNIVERSITY OF REGENSBURG   (Germany)

^d MPI HALBLEITERLABOR   (Germany)

^e PHILIPPS UNIVERSITY MARBURG   (Germany)

^f NONE

Author keywords

[No Author keywords available]

Indexed keywords

EDGE DETECTION; IMAGE RESOLUTION;

COMPRESSIVE STRAIN; CONVERGENCE ANGLE; CROSS CORRELATIONS; EQUIVALENT STRAINS; GROWTH DIRECTIONS; NANOBEAM ELECTRON DIFFRACTION; PNCCD DETECTORS; SPATIAL RESOLUTION;

CCD CAMERAS;

EID: 84890713815     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/471/1/012024     Document Type: Conference Paper

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