Erratum to: "Direct single electron detection with a CMOS detector for electron microscopy". [Nucl. Instr. and Meth. A 546 (2005) 170-175]. (DOI:10.1016/j.nima.2005.03.023);Direct single electron detection with a CMOS detector for electron microscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 546, Issue 1-2, 2005, Pages 170-175

  Faruqi, A R ^a   Henderson, R ^a   Pryddetch, M ^b   Allport, P ^c   Evans, A ^c  

^a MRC LABORATORY OF MOLECULAR BIOLOGY   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

CMOS; Electron microscopy; Imaging; Pixel detector

Indexed keywords

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; ELECTRON MICROSCOPY; FOURIER TRANSFORMS; IMAGING TECHNIQUES; SENSORS; SIGNAL TO NOISE RATIO; X RAY DIFFRACTION ANALYSIS;

MONOLITHIC ACTIVE PIXELS SENSORS (MAPS); PIXEL DETECTORS; POINT SPREAD FUNCTIONS (PSF); SINGLE ELECTRONS;

ELECTRONS;

EID: 20444461658     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.07.013     Document Type: Erratum

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