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Volumn , Issue , 2006, Pages 3-25

EUV source technology: Challenges and status

Author keywords

[No Author keywords available]

Indexed keywords

EXTREME ULTRAVIOLET LITHOGRAPHY;

EID: 84960240460     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1117/3.613774.Ch1     Document Type: Chapter
Times cited : (11)

References (74)
  • 2
    • 85032599135 scopus 로고    scopus 로고
    • See Chapter 2 of this volume.
    • See Chapter 2 of this volume.
  • 3
    • 84960201481 scopus 로고    scopus 로고
    • EUV Source Technology Status, IEUVI Source TWG, San Francisco, CA, private communication
    • V. Bakshi, EUV Source Technology Status, IEUVI Source TWG, San Francisco, CA, private communication (2004).
    • (2004)
    • Bakshi, V.1
  • 4
    • 85032594777 scopus 로고    scopus 로고
    • Flying Circus 2 (FC2): Calibration of an extreme ultraviolet (EUV) source at PLEXLLC
    • ISMT Technology Transfer Report 04024490A-TR, Available at
    • S. A. van der Westen, C. Bruineman, F. Bijkerk, and V. Bakshi, "Flying Circus 2 (FC2): Calibration of an extreme ultraviolet (EUV) source at PLEXLLC, " ISMT Technology Transfer Report 04024490A-TR (2004). Available at www.sematech.org.
    • (2004)
    • S.A.van der, Westen1    Bruineman, C.2    Bijkerk, F.3    Bakshi, V.4
  • 5
    • 85032601014 scopus 로고    scopus 로고
    • Simulation of DPP/LPP hydrodynamicsand radiation transport for EUV lithography
    • EUVL Symposium, Miyazaki, Japan (November). Proceedings available at
    • A. Hassanein, V. Sizyuk, V. Tolkach, et al., "Simulation of DPP/LPP hydrodynamicsand radiation transport for EUV lithography, " EUVL Symposium, Miyazaki, Japan (November 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Hassanein, A.1    Sizyuk, V.2    Tolkach, V.3
  • 6
    • 85032601531 scopus 로고    scopus 로고
    • See Chapter 3 of this volume.
    • See Chapter 3 of this volume.
  • 7
    • 85032594588 scopus 로고    scopus 로고
    • See Section III, DPP EUV Sources, and Section IV, LPP EUV Sources, of this volume.
    • See Section III, DPP EUV Sources, and Section IV, LPP EUV Sources, of this volume.
  • 8
    • 84960201825 scopus 로고    scopus 로고
    • EUV modeling source workshop summary
    • EUV Source Modeling Workshop, Antwerp, Belgium (September). Proceedings available at
    • V. Bakshi, J. Gillaspy, and B. Rice, "EUV modeling source workshop summary, " EUV Source Modeling Workshop, Antwerp, Belgium (September 2003). Proceedings available at www.sematech.org.
    • (2003)
    • Bakshi, V.1    Gillaspy, J.2    Rice, B.3
  • 9
    • 33244485960 scopus 로고    scopus 로고
    • Progress in development of a highpower source for EUV lithography
    • EUV Source Workshop, Miyazaki, Japan (November). Proceedings available at
    • I. Fomenkov, W. Partlo, and N. Bwering, "Progress in development of a highpower source for EUV lithography, " EUV Source Workshop, Miyazaki, Japan (November 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Fomenkov, I.1    Partlo, W.2    Bwering, N.3
  • 10
    • 33244477741 scopus 로고    scopus 로고
    • Philips's EUV source: main messages
    • EUV SourceWorkshop, Miyazaki, Japan (November). Proceedings available at
    • J. Pankert, "Philips's EUV source: main messages, " EUV SourceWorkshop, Miyazaki, Japan (November 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Pankert, J.1
  • 11
    • 33244468662 scopus 로고    scopus 로고
    • EUV source development atXTREME Technologies: An update
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • U. Stamm, J. Kleinschmidt, K. Gäbel, et al., "EUV source development atXTREME Technologies: An update, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Stamm, U.1    Kleinschmidt, J.2    Gäbel, K.3
  • 12
    • 79955887839 scopus 로고    scopus 로고
    • Performance and concepts of EUVA LPP and GDPP technologies
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • A. Endo, "Performance and concepts of EUVA LPP and GDPP technologies, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Endo, A.1
  • 13
    • 85032592890 scopus 로고    scopus 로고
    • Performance of kilowatt-class laser modules in scaling up laser produced plasma (LPP) EUV source
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • S. Ellwi, "Performance of kilowatt-class laser modules in scaling up laser produced plasma (LPP) EUV source, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Ellwi, S.1
  • 14
    • 85032597752 scopus 로고    scopus 로고
    • Modeling laser heating of condensed xenon and extreme ultraviolet (EUV) emissions
    • ISMT Technology Transfer Report 04024496A-TR, Available at
    • H. Milchberg, "Modeling laser heating of condensed xenon and extreme ultraviolet (EUV) emissions, " ISMT Technology Transfer Report 04024496A-TR (2004). Available at www.sematech.org.
    • (2004)
    • Milchberg, H.1
  • 15
    • 33244468662 scopus 로고    scopus 로고
    • EUV source development at XTREME Technologies-an update
    • EUV Source Workshop, Miyazaki, Japan (November). Proceedings available at
    • U. Stamm, "EUV source development at XTREME Technologies-an update, " EUV Source Workshop, Miyazaki, Japan (November 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Stamm, U.1
  • 16
    • 85032593366 scopus 로고    scopus 로고
    • EUV source system development update: Advancing along the pathto HVM source
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • I. V. Fomenkov, D. W. Myers, B. A. Hansson, D. C. Brandt, A. Ershov, and B. Klene, "EUV source system development update: Advancing along the pathto HVM source, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Fomenkov, I.V.1    Myers, D.W.2    Hansson, B.A.3    Brandt, D.C.4    Ershov, A.5    Klene, B.6
  • 17
    • 85032597259 scopus 로고    scopus 로고
    • See Chapter 4 of this volume.
    • See Chapter 4 of this volume.
  • 18
    • 25144478480 scopus 로고    scopus 로고
    • Conversion efficiency of a laser-produced Sn plasma at 13.5 nm, simulatedwith a one-dimensional hydrodynamics model and treated as a multicomponent blackbody
    • A. Cummings, G. O'Sullivan, P. Dunne, E. Sokell, N. Murphy, and J. White, "Conversion efficiency of a laser-produced Sn plasma at 13.5 nm, simulatedwith a one-dimensional hydrodynamics model and treated as a multicomponent blackbody, " J. Phys. D: Appl. Phys. 38, 604-616 (2005).
    • (2005) J. Phys. D: Appl. Phys. , vol.38 , pp. 604-616
    • Cummings, A.1    O'Sullivan, G.2    Dunne, P.3    Sokell, E.4    Murphy, N.5    White, J.6
  • 19
    • 85032604084 scopus 로고    scopus 로고
    • Philips EUV results and roadmap
    • EUV Source Workshop, SantaClara, CA (February). Proceedings available at
    • J. Pankert, "Philips EUV results and roadmap, " EUV Source Workshop, SantaClara, CA (February 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Pankert, J.1
  • 20
    • 3843139365 scopus 로고    scopus 로고
    • Status of Philips Extreme's EUV source
    • J. Pankert, "Status of Philips Extreme's EUV source, " Proc. SPIE 5374, 152-159 (2004).
    • (2004) Proc. SPIE , vol.5374 , pp. 152-159
    • Pankert, J.1
  • 21
    • 85032597613 scopus 로고    scopus 로고
    • Philips EUV source: Update and issues
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • J. Pankert, "Philips EUV source: Update and issues, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Pankert, J.1
  • 22
    • 84960319240 scopus 로고    scopus 로고
    • Modeling of discharge produced plasma for EUV extremesource-II
    • SEMATECH monthly report (April).
    • A. Hassanein, "Modeling of discharge produced plasma for EUV extremesource-II, " SEMATECH monthly report (April 2005).
    • (2005)
    • Hassanein, A.1
  • 23
    • 85032593444 scopus 로고    scopus 로고
    • The UCF tin-doped droplet source
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • M. Richardson, "The UCF tin-doped droplet source, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Richardson, M.1
  • 24
    • 85032602851 scopus 로고    scopus 로고
    • PowerLase, private communication.
    • S. Ellwi, PowerLase, private communication.
    • Ellwi, S.1
  • 25
    • 20844446307 scopus 로고    scopus 로고
    • Characterization of extreme ultravioletemission from laser-produced spherical tin plasma generated with multiplelaser beams
    • Y. Shimada, H. Nishimura, M. Nakai, et al., "Characterization of extreme ultravioletemission from laser-produced spherical tin plasma generated with multiplelaser beams, " Appl. Phys. Lett. 86, 051501 (2005).
    • (2005) Appl. Phys. Lett. , vol.86 , pp. 051501
    • Shimada, Y.1    Nishimura, H.2    Nakai, M.3
  • 26
    • 85032597949 scopus 로고    scopus 로고
    • PLEX source update
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • M. McGeoch, "PLEX source update, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • McGeoch, M.1
  • 27
    • 0030836119 scopus 로고    scopus 로고
    • Intense plasmadischarge source at 13.5 nm for extreme-ultraviolet lithography
    • M. A. Klosner, H. A. Bender, W. T. Silfvast, and J. J. Rocca, "Intense plasmadischarge source at 13.5 nm for extreme-ultraviolet lithography, " Opt. Lett. 22(1), 34-36 (1997).
    • (1997) Opt. Lett. , vol.22 , Issue.1 , pp. 34-36
    • Klosner, M.A.1    Bender, H.A.2    Silfvast, W.T.3    Rocca, J.J.4
  • 28
    • 0033684545 scopus 로고    scopus 로고
    • Development of an EUVL (13.5 nm) light source employing a dense plasma focus in lithium vapor
    • W. Partlo, I. Fomenkov, R. Olive, and D. Birx, "Development of an EUVL (13.5 nm) light source employing a dense plasma focus in lithium vapor, " Proc. SPIE 3997, 136-156 (2000).
    • (2000) Proc. SPIE , vol.3997 , pp. 136-156
    • Partlo, W.1    Fomenkov, I.2    Olive, R.3    Birx, D.4
  • 29
    • 84955601335 scopus 로고    scopus 로고
    • Freescale Semiconductors
    • private communication.
    • P. Naughton, Freescale Semiconductors, private communication.
    • Naughton, P.1
  • 30
    • 84960233662 scopus 로고    scopus 로고
    • International SEMAETCH Manufacturing Initiative (ISMI), private communication.
    • W. Worth, International SEMAETCH Manufacturing Initiative (ISMI), private communication.
    • Worth, W.1
  • 31
    • 85032600599 scopus 로고    scopus 로고
    • Cymer, private communication.
    • D. Brandt, Cymer, private communication.
    • Brandt, D.1
  • 32
    • 85032597674 scopus 로고    scopus 로고
    • Exitech, private communication.
    • M. Gower, Exitech, private communication.
    • Gower, M.1
  • 33
    • 85032600108 scopus 로고    scopus 로고
    • EUVsource evaluation at intermediate focus
    • EUVL Symposium, Miyazaki, Japan (November). Proceedings available at
    • H. Kanazawa, M. Amemiya, K. Fujimoto, J. Ito, and Y. Watanabe, "EUVsource evaluation at intermediate focus, " EUVL Symposium, Miyazaki, Japan (November 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Kanazawa, H.1    Amemiya, M.2    Fujimoto, K.3    Ito, J.4    Watanabe, Y.5
  • 34
    • 85032594313 scopus 로고    scopus 로고
    • Characterization of intermediate focus
    • EUVSource Workshop, San Jose, CA (February). Proceedings available at
    • T. Missalla and M. Schurmann, "Characterization of intermediate focus, " EUVSource Workshop, San Jose, CA (February 2005). Proceedings available atwww.sematech.org.
    • (2005)
    • Missalla, T.1    Schurmann, M.2
  • 35
    • 84960227319 scopus 로고    scopus 로고
    • Intermediate focus metrology development results
    • EUVSource Workshop, Santa Clara, CA (February). Proceedings availableat
    • L. Schmaenok, "Intermediate focus metrology development results, " EUVSource Workshop, Santa Clara, CA (February 2004). Proceedings availableat www.sematech.org.
    • (2004)
    • Schmaenok, L.1
  • 36
    • 84960308818 scopus 로고    scopus 로고
    • Flying Circus 2 milestone #2 report: Diagnostic performance
    • ISMT Technology TransferReport 03044396A-ENG Proceedings available at
    • S. A. van der Westen, R. de Bruijn, F. Bijkerk, and V. Bakshi, "Flying Circus 2 milestone #2 report: Diagnostic performance, " ISMT Technology TransferReport 03044396A-ENG (2003). Proceedings available at www.sematech.org.
    • (2003)
    • van der Westen, S.A.1    de Bruijn, R.2    Bijkerk, F.3    Bakshi, V.4
  • 37
    • 85032596857 scopus 로고    scopus 로고
    • Crosscalibration ofextreme ultraviolet (EUV) energy sensors
    • ISMT Technology Transfer Report 04024498A-TR, Available at
    • S. A. van der Westen, R. de Bruijn, F. Bijkerk, et al., "Crosscalibration ofextreme ultraviolet (EUV) energy sensors, " ISMT Technology Transfer Report 04024498A-TR (2004). Available at www.sematech.org.
    • (2004)
    • van der Westen, S.A.1    de Bruijn, R.2    Bijkerk, F.3
  • 38
    • 85032603899 scopus 로고    scopus 로고
    • EUV source metrology for EUV source development
    • ISMT Technology Transfer Report 04024494A-TR, Available at
    • S. Grantham, "EUV source metrology for EUV source development, "ISMT Technology Transfer Report 04024494A-TR (2004). Available atwww.sematech.org.
    • (2004)
    • Grantham, S.1
  • 39
    • 84960266822 scopus 로고    scopus 로고
    • Multilayerbased instrumentation developments for EUVL source metrology
    • EUVSource Workshop, Santa Clara, CA (February). Proceedings available at
    • L. A. Shmaenok, N. N. Salashchenko, N. I. Chkhalo, et al., "Multilayerbased instrumentation developments for EUVL source metrology, " EUVSource Workshop, Santa Clara, CA (February 2003). Proceedings availableat www.sematech.org.
    • (2003)
    • Shmaenok, L.A.1    Salashchenko, N.N.2    Chkhalo, N.I.3
  • 40
    • 11144356834 scopus 로고    scopus 로고
    • EUV collectors: Design, development, fabrication and testing
    • P. Marczuk, W. Egle, W. Hafner, and A. Matthes, "EUV collectors: Design, development, fabrication and testing, " Proc. SPIE 5193, 39-49 (2003).
    • (2003) Proc. SPIE , vol.5193 , pp. 39-49
    • Marczuk, P.1    Egle, W.2    Hafner, W.3    Matthes, A.4
  • 41
    • 84960272791 scopus 로고    scopus 로고
    • Collector optics for EUV lithography
    • EUV Source Workshop, Santa Clara, CA (February). Proceedings available at
    • P. Marczuk, "Collector optics for EUV lithography, " EUV Source Workshop, Santa Clara, CA (February 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Marczuk, P.1
  • 42
    • 84960244218 scopus 로고    scopus 로고
    • What is needed to enable source for PI1268? An Intel perspective
    • EUV Source Workshop, Santa Clara, CA (February). Proceedings available at
    • R. Bristol, "What is needed to enable source for PI1268? An Intel perspective, "EUV Source Workshop, Santa Clara, CA (February 2004). Proceedingsavailable at www.sematech.org.
    • (2004)
    • Bristol, R.1
  • 43
    • 84960320727 scopus 로고    scopus 로고
    • CXRO Web site
    • CXRO Web site, http://www-cxro.lbl.gov.
  • 44
    • 85032602566 scopus 로고    scopus 로고
    • Tin delivery systemsfor gas discharge sources
    • EUV Source Workshop, San Jose, CA (February). Proceedings available at
    • G. Derra, P. Zink, T. Krücken, A.Weber, and J. Pankert, "Tin delivery systemsfor gas discharge sources, " EUV Source Workshop, San Jose, CA (February 2005). Proceedings available at www.sematech.org.
    • (2005)
    • Derra, G.1    Zink, P.2    Krücken, T.3    Weber, A.4    Pankert, J.5
  • 45
    • 85032599255 scopus 로고    scopus 로고
    • Out of band radiation
    • (out-of-band panel discussion presentation), EUV SourceWorkshop, Miyazaki, Japan (November). Proceedingsavailable at
    • Y. Watanabe, "Out of band radiation" (out-of-band panel discussion presentation), EUV SourceWorkshop, Miyazaki, Japan (November 2004). Proceedingsavailable at www.sematech.org.
    • (2004)
    • Watanabe, Y.1
  • 46
    • 85032597993 scopus 로고    scopus 로고
    • Out of band radiation panel discussion summary
    • (out-of-bandpanel discussion presentation), EUV Source Workshop, Miyazaki, Japan (November). Proceedings available at
    • H. Kondo, "Out of band radiation panel discussion summary" (out-of-bandpanel discussion presentation), EUV Source Workshop, Miyazaki, Japan (November 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Kondo, H.1
  • 47
    • 85032593352 scopus 로고    scopus 로고
    • Out of band radiation panel discussion summary
    • (out-of-bandpanel discussion presentation), EUV Source Workshop, Miyazaki, Japan (November). Proceedings available at
    • V. Bakshi, "Out of band radiation panel discussion summary" (out-of-bandpanel discussion presentation), EUV Source Workshop, Miyazaki, Japan (November 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Bakshi, V.1
  • 48
    • 84960248943 scopus 로고    scopus 로고
    • IEUVI Source TWG meeting, San Jose, CA, March 3, private communication.
    • IEUVI Source TWG meeting, San Jose, CA, March 3, 2005, private communication.
    • (2005)
  • 49
    • 84960204400 scopus 로고    scopus 로고
    • Gas discharge and laser produced plasma sources at XTREME Technologies
    • EUV SourceWorkshop, Santa Clara, CA (February). Proceedingsavailable at
    • U. Stamm, "Gas discharge and laser produced plasma sources at XTREMETechnologies, " EUV SourceWorkshop, Santa Clara, CA (February 2003). Proceedingsavailable at www.sematech.org.
    • (2003)
    • Stamm, U.1
  • 50
    • 1942453850 scopus 로고    scopus 로고
    • EUV spectral purity filters: Opticaland mechanical design, grating fabrication and testing
    • H. Kierey, K. Heidemann, and B. Kleemann, "EUV spectral purity filters: Opticaland mechanical design, grating fabrication and testing, " Proc. SPIE 5193, 70-78 (2004).
    • (2004) Proc. SPIE , vol.5193 , pp. 70-78
    • Kierey, H.1    Heidemann, K.2    Kleemann, B.3
  • 51
    • 0037448232 scopus 로고    scopus 로고
    • Theoretical efficiencyanalysis of a condenser-embedded grating-based spectral purity filter for EUVlithography
    • P. P. Naulleau, C. S. Williams, and D. A. Tichenor, "Theoretical efficiencyanalysis of a condenser-embedded grating-based spectral purity filter for EUVlithography, " Opt. Commun. 214, 31-38 (2003).
    • (2003) Opt. Commun. , vol.214 , pp. 31-38
    • Naulleau, P.P.1    Williams, C.S.2    Tichenor, D.A.3
  • 52
    • 85032594112 scopus 로고    scopus 로고
    • EUV source power and lifetime:The most critical issues for EUV lithography
    • U. Stamm, J. Kleinschmidt, and K. Gäbel, "EUV source power and lifetime:The most critical issues for EUV lithography, " Proc. SPIE 5037, 119-129 (2003).
    • (2003) Proc. SPIE , vol.5037 , pp. 119-129
    • Stamm, U.1    Kleinschmidt, J.2    Gäbel, K.3
  • 53
    • 84960274987 scopus 로고    scopus 로고
    • FC Flying Circus 2:Status and update
    • EUV SourceWorkshop, Santa Clara, CA (February).Proceedings available at
    • S. A. van der Westen, C. Bruineman, E. Louis, et al., "FC Flying Circus 2:Status and update, " EUV SourceWorkshop, Santa Clara, CA (February 2004).Proceedings available at www.sematech.org.
    • (2004)
    • S.A.van der, Westen1    Bruineman, C.2    Louis, E.3
  • 54
    • 84960307548 scopus 로고    scopus 로고
    • FC2 project status andmetrology survey
    • EUV SourceWorkshop, Santa Clara, CA (February).Proceedings available at
    • F. Bijkerk, S. A. van der Westen, R. de Bruijn, et al., "FC2 project status andmetrology survey, " EUV SourceWorkshop, Santa Clara, CA (February 2003).Proceedings available at www.sematech.org.
    • (2003)
    • Bijkerk, F.1    van der Westen, S.A.2    de Bruijn, R.3
  • 55
    • 84960277060 scopus 로고    scopus 로고
    • EUV resist performance trade-offs
    • EUV Source Workshop, San Jose, CA (February). Proceedings availableat
    • R. Brainard, K. Dean, and T. Koehler, "EUV resist performance trade-offs, "EUV Source Workshop, San Jose, CA (February 2005). Proceedings availableat www.sematech.org.
    • (2003)
    • Brainard, R.1    Dean, K.2    Koehler, T.3
  • 56
    • 0032624672 scopus 로고    scopus 로고
    • Advances in multilayer reflectivecoatings for extreme ultraviolet lithography
    • J. A. Folta, S. Bajt, T. W. Barbee, Jr., et al., "Advances in multilayer reflectivecoatings for extreme ultraviolet lithography, " Proc. SPIE 3676, 702-709 (1999).
    • (1999) Proc. SPIE , vol.3676 , pp. 702-709
    • Folta, J.A.1    Bajt, S.2    Barbee, Jr.T.W.3
  • 57
    • 85032596182 scopus 로고    scopus 로고
    • EUVL alpha tools to ship to IMEC, Albany in Q1, says Intel
    • April 14. Available at
    • P. Clarke, "EUVL alpha tools to ship to IMEC, Albany in Q1, says Intel, " EETimes, April 14, 2005. Available at www.eetimes.com.
    • (2005) EETimes
    • Clarke, P.1
  • 58
    • 33244485960 scopus 로고    scopus 로고
    • Performance and properties of a highpower light source for EUV lithography
    • EUV SourceWorkshop, Santa Clara, CA (February). Proceedings available at
    • I. Fomenkov, R. Ness, I. Oliver, et al., "Performance and properties of a highpower light source for EUV lithography, " EUV SourceWorkshop, Santa Clara, CA (February 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Fomenkov, I.1    Ness, R.2    Oliver, I.3
  • 59
    • 84960316913 scopus 로고    scopus 로고
    • Star pinch power and lifetime scaling
    • EUVSource Workshop, Santa Clara, CA (February). Proceedings availableat
    • M. McGeoch and C. Pike, "Star pinch power and lifetime scaling, " EUVSource Workshop, Santa Clara, CA (February 2004). Proceedings availableat www.sematech.org.
    • (2004)
    • McGeoch, M.1    Pike, C.2
  • 60
    • 84960267200 scopus 로고    scopus 로고
    • On the conversion efficiency of LPP-EUV light source
    • EUVSource Workshop, Santa Clara, CA (February). Proceedings available at
    • K. Nishihara, "On the conversion efficiency of LPP-EUV light source, " EUVSource Workshop, Santa Clara, CA (February 2004). Proceedings available atwww.sematech.org.
    • (2004)
    • Nishihara, K.1
  • 61
    • 84960307675 scopus 로고    scopus 로고
    • Philips EUV lamp
    • EUV Source Workshop, Antwerp, Belgium (September). Proceedings available at
    • J. Pankert, "Philips EUV lamp, " EUV Source Workshop, Antwerp, Belgium (September 2003). Proceedings available at www.sematech.org.
    • (2003)
    • Pankert, J.1
  • 63
    • 84960274938 scopus 로고    scopus 로고
    • Laser produced plasma EUV source program
    • EUV SourceWorkshop, Santa Clara, CA (February). Proceedings available at
    • R. Moyer, "Laser produced plasma EUV source program, " EUV SourceWorkshop, Santa Clara, CA (February 2003). Proceedings available atwww.sematech.org.
    • (2003)
    • Moyer, R.1
  • 64
    • 0036378636 scopus 로고    scopus 로고
    • Xenon target performancecharacteristics for laser-produced plasma EUV sources
    • H. Shields, S. W. Fornaca, M. B. Petach, et al., "Xenon target performancecharacteristics for laser-produced plasma EUV sources, " Proc. SPIE 4688, 94-101 (2002).
    • (2002) Proc. SPIE , vol.4688 , pp. 94-101
    • Shields, H.1    Fornaca, S.W.2    Petach, M.B.3
  • 65
    • 85032599054 scopus 로고    scopus 로고
    • Northrop Grumman Corporation, private communication.
    • R. Moyer, Northrop Grumman Corporation, private communication.
    • Moyer, R.1
  • 66
    • 84960247477 scopus 로고    scopus 로고
    • The tin-doped microdropletlaser-plasma EUV source
    • Miyazaki, Japan (November). Proceedings available at
    • M. Richardson, C.-S. Koay, S. George, et al., "The tin-doped microdropletlaser-plasma EUV source, " 3rd International Symposium on EUVLithography, Miyazaki, Japan (November 2004). Proceedings available atwww.sematech.org.
    • (2004) 3rd International Symposium on EUVLithography
    • Richardson, M.1    Koay, C.-S.2    George, S.3
  • 68
    • 84960231538 scopus 로고    scopus 로고
    • EUV source concept: Scalable DPSS laser and contained target generator
    • EUV Source Workshop, Santa Clara, CA (February). Proceedings available at
    • S. Bloom, "EUV source concept: Scalable DPSS laser and contained targetgenerator, " EUV Source Workshop, Santa Clara, CA (February 2004). Proceedingsavailable at www.sematech.org.
    • (2004)
    • Bloom, S.1
  • 69
    • 84878607894 scopus 로고    scopus 로고
    • Advanced micro devices
    • private communication.
    • O. Wood, "Advanced micro devices, " private communication.
    • Wood, O.1
  • 70
    • 24644489086 scopus 로고    scopus 로고
    • High conversion efficiency microscopictin-doped droplet target laser-plasma source for EUVL
    • C.-S. Koay, S. George, K. Takenoshita, et al., "High conversion efficiency microscopictin-doped droplet target laser-plasma source for EUVL, " Proc. SPIE 5751, 279-292 (2005).
    • (2005) Proc. SPIE , vol.5751 , pp. 279-292
    • Koay, C.-S.1    George, S.2    Takenoshita, K.3
  • 71
    • 24644456865 scopus 로고    scopus 로고
    • EUV source system development update: Advancing along thepath to HVM
    • D. W. Myers, I. V. Fomenkov, B. A. M. Hansson, B. C. Klene, andD. C. Brandt, "EUV source system development update: Advancing along thepath to HVM, " Proc. SPIE 5751, 248-259 (2005).
    • (2005) Proc. SPIE , vol.5751 , pp. 248-259
    • Myers, D.W.1    Fomenkov, I.V.2    Hansson, B.A.M.3    Klene, B.C.4    Brandt, D.C.5
  • 72
    • 84960263507 scopus 로고    scopus 로고
    • Joint requirements-ASML, Nikon, and Cannon
    • EUV SourceWorkshop, Santa Clara, CA (February). Proceedings available at
    • Y.Watanabe, "Joint requirements-ASML, Nikon, and Cannon, " EUV SourceWorkshop, Santa Clara, CA (February 2004). Proceedings available at www.sematech.org.
    • (2004)
    • Watanabe, Y.1
  • 73
    • 84960265344 scopus 로고    scopus 로고
    • EUV Source Workshop summary
    • EUV Source Workshop, Antwerp, Belgium (September). Proceedings available at
    • V. Bakshi, "EUV Source Workshop summary, " EUV Source Workshop, Antwerp, Belgium (September 2003). Proceedings available at www.sematech.org.
    • (2003)
    • Bakshi, V.1
  • 74
    • 84960224696 scopus 로고    scopus 로고
    • Meeting showed EUVL problems diminishing, claims SEMATECH
    • February 26
    • P. Clarke, "Meeting showed EUVL problems diminishing, claims SEMATECH, " Silicon Strategies, February 26, 2004.
    • (2004) Silicon Strategies
    • Clarke, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.