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Volumn 112, Issue 46, 2015, Pages 14144-14149

Molecular pathways for defect annihilation in directed self-assembly

Author keywords

Copolymer; Defect|minimum free energy path; Directed self assembly; String method

Indexed keywords

COPOLYMER;

EID: 84957535434     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1508225112     Document Type: Article
Times cited : (109)

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