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Volumn 4, Issue 1, 2015, Pages 11-15

Simulation of defect reduction in block copolymer thin films by solvent annealing

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Indexed keywords


EID: 84921364731     PISSN: None     EISSN: 21611653     Source Type: Journal    
DOI: 10.1021/mz500705q     Document Type: Article
Times cited : (85)

References (45)
  • 24
    • 84921360457 scopus 로고    scopus 로고
    • note
    • When the solvent evaporation is much slower than this, polymer chains have sufficient time to rearrange during the evaporation period, leading to morphologies with different domain sizes and defectivity. For concreteness, however, in this first study on solvent annealing, we focus on fast solvent evaporation.
  • 44
    • 84921360456 scopus 로고    scopus 로고
    • note
    • A "defect-free" structure is defined as one in which all the lamellar domains are completely uninterrupted, without any bridges or connections between domains. In contrast, "defective" structures exhibit interrupted lamellae.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.