-
1
-
-
0031359494
-
Reactive ion etching for high aspect ratio silicon micromachining
-
Rangelow IW 1997 Reactive ion etching for high aspect ratio silicon micromachining Surf. Coat. Technol. 97 140-50
-
(1997)
Surf. Coat. Technol.
, vol.97
, pp. 140-150
-
-
Rangelow, I.W.1
-
2
-
-
70350647602
-
Capabilities of ICP-RIE cryogenic dryetching of silicon: Review of exemplary microstructures
-
Sokmen U, Stranz A, Fundling S, Wehmann H-H, Bandalo V, Bora A, Tornow M, Waag A and Peiner E 2009 Capabilities of ICP-RIE cryogenic dryetching of silicon: review of exemplary microstructures J. Micromech. Microeng. 19 105005
-
(2009)
J. Micromech. Microeng.
, vol.19
, pp. 105005
-
-
Sokmen, U.1
Stranz, A.2
Fundling, S.3
Wehmann, H.-H.4
Bandalo, V.5
Bora, A.6
Tornow, M.7
Waag, A.8
Peiner, E.9
-
3
-
-
0035929081
-
Silicon micromachining using a high-density plasma source
-
McAuley SA, Ashraf H, Atabo L, Chambers A, Hall S, Hopkins J and Nicholls G 2001 Silicon micromachining using a high-density plasma source J. Phys. D 34 2769-74
-
(2001)
J. Phys. D
, vol.34
, pp. 2769-2774
-
-
McAuley, S.A.1
Ashraf, H.2
Atabo, L.3
Chambers, A.4
Hall, S.5
Hopkins, J.6
Nicholls, G.7
-
5
-
-
70350663007
-
Complex three-dimensional structures in Si (100) using wet bulk micromachining
-
Pal P and Sato K 2009 Complex three-dimensional structures in Si (100) using wet bulk micromachining J. Micromech. Microeng. 19 105008
-
(2009)
J. Micromech. Microeng.
, vol.19
, pp. 105008
-
-
Pal, P.1
Sato, K.2
-
6
-
-
0035975568
-
The effect of isopropyl alcohol on etching rate and roughness of (100) Si surface etched in KOH and TMAH solutions
-
Zubel I and Kramkowska M 2001 The effect of isopropyl alcohol on etching rate and roughness of (100) Si surface etched in KOH and TMAH solutions Sens. Actuators, A 93 138-47
-
(2001)
Sens. Actuators, A
, vol.93
, pp. 138-147
-
-
Zubel, I.1
Kramkowska, M.2
-
7
-
-
39349109659
-
Pore formation in silicon by wet etching using micrometer-sized metal particles as catalysts
-
Lee CL, Tsujino K, Kanda Y, Ikeda S and Matsumura M 2008 Pore formation in silicon by wet etching using micrometer-sized metal particles as catalysts J. Mater. Chem. 18 1015-20
-
(2008)
J. Mater. Chem.
, vol.18
, pp. 1015-1020
-
-
Lee, C.L.1
Tsujino, K.2
Kanda, Y.3
Ikeda, S.4
Matsumura, M.5
-
8
-
-
17844363741
-
Boring deep cylindrical nanoholes in silicon using nanoparticles as a catalyst
-
Tsujino K and Matsumura M 2005 Boring deep cylindrical nanoholes in silicon using nanoparticles as a catalyst Adv. Mater. 17 1045-7
-
(2005)
Adv. Mater.
, vol.17
, pp. 1045-1047
-
-
Tsujino, K.1
Matsumura, M.2
-
10
-
-
84880309972
-
Ultra-low reflectivity polycrystalline silicon surfaces formed by surface structure chemical transfer method
-
Imamura K, Franco F C, Matsumoto T and Kobayashi H 2013 Ultra-low reflectivity polycrystalline silicon surfaces formed by surface structure chemical transfer method Appl. Phys. Lett. 103 013110
-
(2013)
Appl. Phys. Lett.
, vol.103
, pp. 013110
-
-
Imamura, K.1
Franco, F.C.2
Matsumoto, T.3
Kobayashi, H.4
-
11
-
-
85016861276
-
Surface structure chemical transfer method for formation of ultralow reflectivity Si surfaces
-
Takahashi M, Fukushima T, Seino Y, Kim W B, Imamura K and Kobayashi H 2013 Surface structure chemical transfer method for formation of ultralow reflectivity Si surfaces J. Electrochem. Soc. 160 H443-5
-
(2013)
J. Electrochem. Soc.
, vol.160
, pp. H443-H445
-
-
Takahashi, M.1
Fukushima, T.2
Seino, Y.3
Kim, W.B.4
Imamura, K.5
Kobayashi, H.6
-
13
-
-
0022813071
-
Modelingof minority carrier transport in heavily doped silicon emitters
-
Del Alamo J and Swanson R 1987 Modelingof minority carrier transport in heavily doped silicon emitters Solid State Electron. 30 1127-36
-
(1987)
Solid State Electron.
, vol.30
, pp. 1127-1136
-
-
Del Alamo, J.1
Swanson, R.2
-
14
-
-
77955556406
-
Tip-based nanomanufacturing by electrical, chemical, mechanical and thermal processes
-
Malshe A P, Rajurkar K P, Virwani K R, Taylor C R, Bourell D L, Levy G, Sundaram M M, McGeough J A, Kalyanasundaram V and Samant A N 2010 Tip-based nanomanufacturing by electrical, chemical, mechanical and thermal processes CIRPAnn 59 628-51
-
(2010)
CIRPAnn
, vol.59
, pp. 628-651
-
-
Malshe, A.P.1
Rajurkar, K.P.2
Virwani, K.R.3
Taylor, C.R.4
Bourell, D.L.5
Levy, G.6
Sundaram, M.M.7
McGeough, J.A.8
Kalyanasundaram, V.9
Samant, A.N.10
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