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Volumn 103, Issue 1, 2013, Pages
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Ultra-low reflectivity polycrystalline silicon surfaces formed by surface structure chemical transfer method
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER LIFETIME;
ENERGY GAP;
HYDROFLUORIC ACID;
NANOCRYSTALS;
POLYCRYSTALLINE MATERIALS;
SILICON WAFERS;
SURFACE STRUCTURE;
ACID SOLUTIONS;
CHEMICAL TRANSFER;
NANOCRYSTALLINE SI;
PEAK MAXIMA;
POLYCRYSTALLINE-SI;
SI LAYER;
SI SURFACES;
SI WAFER;
SILICON SURFACES;
TRANSFER METHOD;
REFLECTION;
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EID: 84880309972
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.4813089 Document Type: Article |
Times cited : (19)
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References (16)
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