Test time minimization for hybrid BIST of core-based systems

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 318-323

  Jervan, G ^a   Eles, P ^a   Peng, Z ^a   Ubar, R ^b   Jenihhin, M ^b  

^a LINKÖPING UNIVERSITY   (Sweden)

^b TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; ITERATIVE METHODS;

CALCULATION PROCESS; DETERMINISTIC TEST PATTERN; FAST ESTIMATION; ITERATIVE ALGORITHM; MEMORY CONSTRAINTS; NEAR-OPTIMAL SOLUTIONS; OPTIMAL COMBINATION; PSEUDO-RANDOM TESTS;

TESTING;

EID: 84954435426     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250830     Document Type: Conference Paper

References (13)

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