Measuring Lattice Strain in Three Dimensions through Electron Microscopy

Nano Letters

Volumn 15, Issue 10, 2015, Pages 6996-7001

  Goris, Bart ^a   De Beenhouwer, Jan ^a   De Backer, Annick ^a   Zanaga, Daniele ^a   Batenburg, K Joost ^b   Sánchez Iglesias, Ana ^c   Liz Marzán, Luis M ^c,d   Van Aert, Sandra ^a   Bals, Sara ^a   Sijbers, Jan ^a   Van Tendeloo, Gustaaf ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b CWI   (Netherlands)

^c CIC BIOMAGUNE   (Spain)

^d BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

3D lattice strain; Atomic resolution; Au nanodecahedron; electron tomography

Indexed keywords

ATOMS; ELECTRIC IMPEDANCE TOMOGRAPHY; TOMOGRAPHY;

3D CHARACTERIZATION; 3D LATTICES; ATOMIC COORDINATE; ATOMIC RESOLUTION; ELECTRON TOMOGRAPHY; MODEL BASED APPROACH; THREE DIMENSIONS; THREEDIMENSIONAL (3-D);

ELECTRONS;

EID: 84944314356     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.5b03008     Document Type: Article

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