Cross-sectional mapping of hole concentrations as a function of copper treatment in CdTe photo-voltaic devices

Progress in Photovoltaics: Research and Applications

Volumn 23, Issue 11, 2015, Pages 1466-1474

  Korevaar, Bas A ^a   Zorn, Gilad ^a   Raghavan, Kamala C ^a   Cournoyer, James R ^a   Dovidenko, Katharine ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

carrier density; CdTe; scanning capacitance microscopy; solar cells

Indexed keywords

CADMIUM CHLORIDE; CAPACITANCE; CARRIER CONCENTRATION; CHLORINE COMPOUNDS; COPPER; EFFICIENCY; II-VI SEMICONDUCTORS; SCANNING; SOLAR CELLS;

CAPACITANCE VOLTAGE MEASUREMENTS; CDTE; CDTE SOLAR CELLS; COPPER TREATMENT; DENSITY DISTRIBUTIONS; DEVICE PERFORMANCE; SCANNING CAPACITANCE MICROSCOPY; VAN DER PAUW HALL MEASUREMENTS;

CADMIUM TELLURIDE;

EID: 84944176157     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2576     Document Type: Article

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