First-principles-based analysis of the influence of Cu on CdTe electronic properties

Thin Solid Films

Volumn 535, Issue 1, 2013, Pages 322-325

  Krasikov, D ^a   Knizhnik, A ^a   Potapkin, B ^a   Selezneva, S ^b   Sommerer, T ^b  

^a KINTECH LAB LTD   (Russian Federation)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

CdTe; Compensation; Computer simulation; Copper doping; First principles

Indexed keywords

CDTE; COPPER DOPING; DEFECT COMPENSATION; ELEVATED TEMPERATURE; FIRST PRINCIPLES; FREE CARRIER CONCENTRATION; KINETICS OF DEFECTS; THERMODYNAMIC MODEL;

CADMIUM TELLURIDE; CALCULATIONS; COMPENSATION (PERSONNEL); COMPUTER SIMULATION; COPPER; DEFECTS; ELECTRONIC PROPERTIES;

COPPER COMPOUNDS;

EID: 84878196602     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.10.027     Document Type: Conference Paper

References (15)

1. E. Kučys, J. Jerhot, K. Bertulis, and V. Bariss Phys. Status Solidi A 59 1980 91
2. T.A. Gessert, S. Asher, S. Johnston, A. Duda, M.R. Young, and T. Moriarty Conference Paper, IEEE 4th World Conference on Photovoltaic Energy Conversion, Hawaii May 7-12 2006 432
3. S.-H. Wei, and S.B. Zhang Phys. Rev. B 66 2002 155211
4. K.K. Chin Sol. Energy Mater. Sol. Cells 94 2010 1627
5. J. Ma, S.-H. Wei, T.A. Gessert, and K.K. Chin Phys. Rev. B 83 2011 245207
6. G. Kresse, and J. Hafner Phys. Rev. B 47 1993 558 (ibid. 49 (1994) 14251)
7. G. Kresse, and J. Furthmüller Comput. Mater. Sci. 6 1996 15
8. G. Kresse, and D. Joubert Phys. Rev. B 59 1999 1758
9. A.V. Krukau, O.A. Vydrov, A.F. Izmailov, and G.E. Scuseria J. Chem. Phys. 125 2006 224106
10. C.G. Van de Walle, and J. Neugebauer J. Appl. Phys. 95 2004 3851
11. J.L. Cruz-Campa, and D. Zubia Sol. Energy Mater. Sol. Cells 93 2009 15
12. S.-Y. Ma, and S.-Q. Wang Eur. Phys. J. B 72 2009 567
13. R. Grill, L. Turjanska, J. Franc, E. Belas, I. Turkevych, and P. Höschl Phys. Status Solidi B 229 1 2002 161
14. E.D. Jones, N.M. Stewart, and J.B. Mullin J. Cryst. Growth 117 1992 244
15. M.-H. Du, H. Takenaka, and D.J. Singh J. Appl. Phys. 104 2008 093521