Ultra low cost analog BIST using spectral analysis

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 77-82

  Negreiros, M ^a   Carro, L ^a   Susin, A A ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Analog circuits; Autocorrelation; Built in self test; Circuit noise; Circuit testing; Costs; Digital signal processing; Frequency; Spectral analysis; System testing

Indexed keywords

ANALOG CIRCUITS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOCORRELATION; BUILT-IN SELF TEST; COSTS; DIGITAL SIGNAL PROCESSING; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; SEMICONDUCTOR DEVICE MANUFACTURE; SIGNAL PROCESSING; SPECTRUM ANALYSIS; SYSTEM-ON-CHIP; VLSI CIRCUITS;

CIRCUIT NOISE; CIRCUIT TESTING; FREQUENCY; LOW COST METHODS; MATHEMATICAL FRAMEWORKS; OVERSAMPLING TECHNIQUE; SYSTEM TESTING; TEST EXAMPLES;

COST BENEFIT ANALYSIS;

EID: 84943544457     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197636     Document Type: Conference Paper

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