Testing mixed-signal cores: Practical oscillation-based test in an analog macrocell

Proceedings of the Asian Test Symposium

Volumn , Issue , 2000, Pages 31-38

  Huertas, G ^a   Vazquez, D ^a   Peralias, E ^a   Rueda, A ^a   Huertas, J L ^a  

^a UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

MIXED SIGNAL INTEGRATED CIRCUITS; OSCILLATION-BASED TEST (OBT);

ANALOG TO DIGITAL CONVERSION; CIRCUIT OSCILLATIONS; INTEGRATED CIRCUIT LAYOUT; WAVEFORM ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 0034512304     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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