Analog circuit testing based on sensitivity computation and new circuit modeling

Proceedings of the International Test Conference

Volumn , Issue , 1993, Pages 652-661

  Hamida, Naim Ben ^a   Kaminska, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT LAYOUT; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS; STATISTICAL TESTS;

ANALOG CIRCUIT TESTING; CIRCUIT MODELING; CIRCUIT STRUCTURE; SENSITIVITY COMPUTATION;

INTEGRATED CIRCUIT TESTING;

EID: 0027882777     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)