DFT techniques for mixed-signal integrated circuits

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 1997, Pages 251-271

  Roberts, Gordon W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT;

DESIGN FOR TESTING (DFT) METHOD; MIXED SIGNAL INTEGRATED CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0030649562     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)