Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2000, Pages 237-246

  Tofte, Jan Arild ^a   Ong, Chee Kian ^a   Huang, Jiun Lang ^a   Cheng, Kwang Ting ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CORRELATION METHODS; DIGITAL SIGNAL PROCESSING; ELECTRIC CONVERTERS; LINEAR NETWORKS; MIXER CIRCUITS; SIGNAL DISTORTION; WHITE NOISE;

DEVICE UNDER TEST; MIXED SIGNAL CIRCUITS; PSEUDO RANDOM TESTING TECHNIQUE;

INTEGRATED CIRCUIT TESTING;

EID: 0033749133     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (12)