-
1
-
-
0034477890
-
Error Catch and Analysis for Semiconductor Memories Using March Tests
-
C.-F. Wu, C.-T. Huang, C.W. Wang, K.-L. Cheng, C.-W. Wu, Error Catch and Analysis for Semiconductor Memories Using March Tests, IEEE/ACM International Conference on Computer Aided Design, 2000, pp. 468-471
-
IEEE/ACM International Conference on Computer Aided Design, 2000
, pp. 468-471
-
-
Wu, C.-F.1
Huang, C.-T.2
Wang, C.W.3
Cheng, K.-L.4
Wu, C.-W.5
-
2
-
-
0348120352
-
Automatic verification of in-order execution in microprocessors with fragmented pipelines and multicycle functional units
-
P. Mishra, H. Tomiyama, N. Dutt, A. Nicolau, "Automatic verification of in-order execution in microprocessors with fragmented pipelines and multicycle functional units", DATE: IEEE Design, Automation & Test in Europe, 2002, pp. 36-43
-
(2002)
DATE: IEEE Design, Automation & Test in Europe
, pp. 36-43
-
-
Mishra, P.1
Tomiyama, H.2
Dutt, N.3
Nicolau, A.4
-
5
-
-
0034997102
-
Methodology for synthesis, testing, and verification of pipelined architecture processors from behavioral-level-only HDL code and a case study example
-
J. R. Heath, S. Durbha, "Methodology for synthesis, testing, and verification of pipelined architecture processors from behavioral-level-only HDL code and a case study example", Proc. IEEE SoutheastCon, 2001, pp. 143-149
-
Proc. IEEE SoutheastCon, 2001
, pp. 143-149
-
-
Heath, J.R.1
Durbha, S.2
-
7
-
-
84949798789
-
Evolutionary Test Program Induction for Microprocessor Design Verification
-
F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero, "Evolutionary Test Program Induction for Microprocessor Design Verification", Asian Test Symposium, 2002, pp. 368-373
-
Asian Test Symposium, 2002
, pp. 368-373
-
-
Corno, F.1
Cumani, G.2
Reorda, M.S.3
Squillero, G.4
-
9
-
-
84893681164
-
On the Test of Microprocessor IP Cores
-
F. Corno, M. Sonza Reorda, G. Squillero, M. Violante, "On the Test of Microprocessor IP Cores", DATE: IEEE Design, Automation & Test in Europe, 2001, pp. 209-213
-
(2001)
DATE: IEEE Design, Automation & Test in Europe
, pp. 209-213
-
-
Corno, F.1
Reorda, M.S.2
Squillero, G.3
Violante, M.4
-
11
-
-
0032656331
-
High-Level Test Generation for Design Verification of Pipelined Microprocessors
-
D. Van Campenhout, T. N. Mudge, J. P. Hayes, "High-Level Test Generation for Design Verification of Pipelined Microprocessors", Design Automation Conference, 1999, pp. 185-188
-
Design Automation Conference, 1999
, pp. 185-188
-
-
Van Campenhout, D.1
Mudge, T.N.2
Hayes, J.P.3
-
12
-
-
1642612182
-
Fully Automatic Test Program Generation for Microprocessor Cores
-
F. Corno, G. Cumani, M. Sonza Reorda, G. Squillero, "Fully Automatic Test Program Generation for Microprocessor Cores", DATE: IEEE Design, Automation & Test in Europe, 2003, pp. 1006-1011
-
(2003)
DATE: IEEE Design, Automation & Test in Europe
, pp. 1006-1011
-
-
Corno, F.1
Cumani, G.2
Reorda, M.S.3
Squillero, G.4
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