Evolutionary test program induction for microprocessor design verification

Proceedings of the Asian Test Symposium

Volumn 2002-January, Issue , 2002, Pages 368-373

  Corno, F ^a   Cumani, G ^a   Sonza Reorda, M ^a   Squillero, G ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Automatic testing; Circuit simulation; Circuit testing; Costs; Debugging; Error correction; Integrated circuit testing; Microprocessors; Radio access networks; System testing

Indexed keywords

AUTOMATIC TESTING; CIRCUIT SIMULATION; COMPUTER DEBUGGING; COSTS; ERROR CORRECTION; INTEGRATED CIRCUIT DESIGN; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; PROGRAM DEBUGGING;

ASSEMBLY LANGUAGE; CIRCUIT TESTING; DESIGN VERIFICATION; ELECTRONIC DEVICE; MICROPROCESSOR CORE; MICROPROCESSOR DESIGNS; RADIO ACCESS NETWORKS; SYSTEM TESTING;

SOFTWARE TESTING;

EID: 84949798789     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2002.1181739     Document Type: Conference Paper

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