Parity-based output compaction for core-based SOCs [logic testing]

Proceedings of the European Test Workshop

Volumn 2003-January, Issue , 2003, Pages 15-20

  Sinanoglu, O ^a   Orailoglu, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Application software; Bandwidth; Channel allocation; Circuit faults; Circuit testing; Compaction; Computer science; Parallel processing; Test data compression; Transportation

Indexed keywords

APPLICATION PROGRAMS; BANDWIDTH; BANDWIDTH COMPRESSION; COMPUTER SCIENCE; COST EFFECTIVENESS; DATA COMPRESSION; DATA HANDLING; PROGRAMMABLE LOGIC CONTROLLERS; SOFTWARE TESTING; SYSTEM-ON-CHIP; TRANSPORTATION;

CHANNEL ALLOCATION; CIRCUIT FAULTS; CIRCUIT TESTING; PARALLEL PROCESSING; TEST DATA COMPRESSION;

COMPACTION;

EID: 84942895583     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2003.1231663     Document Type: Conference Paper

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