Low temperature annealed zinc oxide nanostructured thin film-based transducers: Characterization for sensing applications

PLoS ONE

Volumn 10, Issue 7, 2015, Pages

  Haarindraprasad, R ^a   Hashim, U ^a   Gopinath, Subash C B ^a   Kashif, Mohd ^a   Veeradasan, P ^a   Balakrishnan, S R ^a   Foo, K L ^a   Poopalan, P ^a   Mishra, Yogendra Kumar ^b  

^a UNIVERSITY MALAYSIA PERLIS   (Malaysia)

^b Institute for Materials Science   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

NANOMATERIAL; SILICON; ZINC OXIDE;

ANALYTIC METHOD; ARTICLE; ELECTRODE; FILM; LOW TEMPERATURE; MORPHOLOGY; PH; REFRACTION INDEX; SYNTHESIS; THICKNESS; TRANSDUCER; X RAY DIFFRACTION; CHEMISTRY; COLD; SCANNING ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

COLD TEMPERATURE; CRYSTALLOGRAPHY, X-RAY; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; ZINC OXIDE;

EID: 84940567709     PISSN: None     EISSN: 19326203     Source Type: Journal    
DOI: 10.1371/journal.pone.0132755     Document Type: Article

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